Inventor · disambiguated record
Jian Yang
Also filed as: YANG JIAN · YANG JIAN-MING
6 granted patents·7 pending applications·22 citations·filing 2000–2024
75Inventor score
Files withTRUMPF MEDIZIN SYSTEME GMBH & CO KG3TANKEBLUE SEMICONDUCTOR CO LTD2ATRENTA INC1BACKMAN VADIM1NAT SCIENCE COUNCIL1
Top patents by PatentIndex Score
13 records- 0186US8037918B2Pick-up heads and systems for die bonding and related applicationsSTATS CHIPPAC INC·Filed 2006·Granted Oct 18, 2011·17 cites·16 claims
- 0269US2024216204A1Operating table having emergency modeTRUMPF MEDIZIN SYSTEME GMBH & CO KG·Filed 2024·Application pending·0 cites
- 0360US11951048B2Some functional parts of operating table and operating tableTRUMPF MEDIZIN SYSTEME GMBH & CO KG·Filed 2020·Granted Apr 9, 2024·0 cites·19 claims
- 0460US11083658B2Some functional parts of operating table and operating tableTRUMPF MEDIZIN SYSTEME GMBH & CO KG·Filed 2017·Granted Aug 10, 2021·1 cites·12 claims
- 0550US11781222B2Layered polycrystalline lead selenide photoelectric film and fabrication method thereofUNIV JIANGSU·Filed 2021·Granted Oct 10, 2023·0 cites·9 claims
- 0646US6380773B1Prescalar using fraction division theoryNAT SCIENCE COUNCIL·Filed 2000·Granted Apr 30, 2002·4 cites·9 claims
- 0746US2023108919A1Method for predicting fracture height during fracturing stimulation in multi-layer formationUNIV SOUTHWEST PETROLEUM·Filed 2022·Application pending·0 cites
- 0842US2006155178A1Multi-dimensional elastic light scatteringBACKMAN VADIM·Filed 2005·Application pending·0 cites
- 0942US2023295838A1High quality silicon carbide seed crystal, silicon carbide crystal, silicon carbide substrate, and preparation method thereforTANKEBLUE SEMICONDUCTOR CO LTD·Filed 2021·Application pending·0 cites
- 1040US12135346B2Multi-dimensional analysis method for tripping risk of whole transmission line due to lightning shielding failureSTATE GRID ZHEJIANG ELECTRIC POWER CO LTD TAIZHOU POWER SUPPLY COMPANY·Filed 2021·Granted Nov 5, 2024·0 cites·4 claims
- 1140US2024105782A1Monocrystalline silicon carbide substrate, method for manufacturing the same, and semiconductor deviceTANKEBLUE SEMICONDUCTOR CO LTD·Filed 2023·Application pending·0 cites
- 1236US2016063162A1System and method using pass/fail test results to prioritize electronic design verification reviewSYNOPSYS INC·Filed 2015·Application pending·0 cites
- 1335US2015379186A1System and method for grading and selecting simulation tests using property coverageATRENTA INC·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →