Inventor · disambiguated record
Thomas J. Eckenrode
Also filed as: ECKENRODE THOMAS · ECKENRODE THOMAS J
10 granted patents·315 citations·filing 1992–2007
91Inventor score
Top patents by PatentIndex Score
10 records- 0194US7168005B2Programable multi-port memory BIST with compact microcodeCADENCE DESIGN SYSTEMS INC·Filed 2003·Granted Jan 23, 2007·91 cites·41 claims
- 0292US6557127B1Method and apparatus for testing multi-port memoriesCADENCE DESIGN SYSTEMS INC·Filed 2000·Granted Apr 29, 2003·67 cites·18 claims
- 0387US6874111B1System initialization of microcode-based memory built-in self-testIBM·Filed 2000·Granted Mar 29, 2005·48 cites·15 claims
- 0483US6651201B1Programmable memory built-in self-test combining microcode and finite state machine self-testIBM·Filed 2000·Granted Nov 18, 2003·36 cites·20 claims
- 0572US7003704B2Two-dimensional redundancy calculationIBM·Filed 2002·Granted Feb 21, 2006·20 cites·13 claims
- 0660US6907554B2Built-in self test system and method for two-dimensional memory redundancy allocationIBM·Filed 2003·Granted Jun 14, 2005·11 cites·20 claims
- 0755US7760135B2Robust pulse deinterleavingLOCKHEED CORP·Filed 2007·Granted Jul 20, 2010·5 cites·17 claims
- 0853US5363379AFDDI network test adaptor error injection circuitIBM·Filed 1992·Granted Nov 8, 1994·31 cites·2 claims
- 0938US7032144B2Method and apparatus for testing multi-port memoriesCADENCE DESIGN SYSTEMS INC·Filed 2003·Granted Apr 18, 2006·1 cites·12 claims
- 1029US5394390AFDDI network test adapter history store circuit (HSC)IBM·Filed 1993·Granted Feb 28, 1995·5 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →