Inventor · disambiguated record
Yutaka Ikku
Also filed as: IKKU YUTAKA
18 granted patents·4 pending applications·249 citations·filing 1994–2018
94Inventor score
Files withSII NANOTECHNOLOGY INC12HITACHI HIGH TECH SCIENCE CORP5IKKU YUTAKA2SEIKO INSTR INC2HASEGAWA KIYOSHI1
Top patents by PatentIndex Score
22 records- 0194US5525806AFocused charged beam apparatus, and its processing and observation methodSEIKO INSTR INC·Filed 1994·Granted Jun 11, 1996·102 cites·6 claims
- 0293US7627088B2X-ray tube and X-ray analysis apparatusSII NANOTECHNOLOGY INC·Filed 2008·Granted Dec 1, 2009·20 cites·5 claims
- 0392US7442942B2Charged particle beam apparatusSII NANOTECHNOLOGY INC·Filed 2006·Granted Oct 28, 2008·20 cites·5 claims
- 0491US8611493B2X-ray fluorescence analyzer and X-ray fluorescence analysis methodHASEGAWA KIYOSHI·Filed 2011·Granted Dec 17, 2013·12 cites·11 claims
- 0591US7436926B2Fluorescent X-ray analysis apparatusSII NANOTECHNOLOGY INC·Filed 2007·Granted Oct 14, 2008·19 cites·16 claims
- 0688US7634054B2X-ray tube and X-ray analysis apparatusSII NANOTECHNOLOGY INC·Filed 2008·Granted Dec 15, 2009·12 cites·6 claims
- 0783US7973280B2Composite charged particle beam apparatus, method of processing a sample and method of preparing a sample for a transmission electron microscope using the sameSII NANOTECHNOLOGY INC·Filed 2009·Granted Jul 5, 2011·7 cites·9 claims
- 0882US6888149B2Focused ion beam apparatusSEIKO INSTR INC·Filed 2003·Granted May 3, 2005·19 cites·19 claims
- 0981US7423266B2Sample height regulating method, sample observing method, sample processing method and charged particle beam apparatusSII NANOTECHNOLOGY INC·Filed 2006·Granted Sep 9, 2008·7 cites·20 claims
- 1075US7531796B2Focused ion beam apparatus and sample section forming and thin-piece sample preparing methodsSII NANOTECHNOLOGY INC·Filed 2007·Granted May 12, 2009·3 cites·6 claims
- 1172US7518109B2Method and apparatus of measuring thin film sample and method and apparatus of fabricating thin film sampleSII NANOTECHNOLOGY INC·Filed 2007·Granted Apr 14, 2009·3 cites·20 claims
- 1269US7595488B2Method and apparatus for specifying working position on a sample and method of working the sampleSII NANOTECHNOLOGY INC·Filed 2005·Granted Sep 29, 2009·2 cites·20 claims
- 1367US7054506B2Pattern measuring method and measuring system using display microscope imageSII NANOTECHNOLOGY INC·Filed 2002·Granted May 30, 2006·13 cites·7 claims
- 1467US7002150B2Thin specimen producing method and apparatusSII NANOTECHNOLOGY INC·Filed 2004·Granted Feb 21, 2006·6 cites·7 claims
- 1564US9820370B2Heat transfer system for an inductively coupled plasma deviceHITACHI HIGH-TECH SCIENCE CORP·Filed 2016·Granted Nov 14, 2017·1 cites·3 claims
- 1658US6924481B2Scanning microscope with brightness controlSII NANOTECHNOLOGY INC·Filed 2002·Granted Aug 2, 2005·3 cites·10 claims
- 1752US2009134327A1Defect recognizing method, defect observing method, and charged particle beam apparatusIKKU YUTAKA·Filed 2008·Application pending·0 cites
- 1851US2009283677A1Section image acquiring method using combined charge particle beam apparatus and combined charge particle beam apparatusIKKU YUTAKA·Filed 2009·Application pending·0 cites
- 1948US10309903B2ICP emission spectrophotometerHITACHI HIGH TECH SCIENCE CORP·Filed 2018·Granted Jun 4, 2019·0 cites·8 claims
- 2036US2016290862A1Sequential icp optical emission spectrometer and method for correcting measurement wavelengthHITACHI HIGH-TECH SCIENCE CORP·Filed 2016·Application pending·0 cites
- 2134US9349572B2Energy dispersive X-ray analyzer and method for energy dispersive X-ray analysisHITACHI HIGH TECH SCIENCE CORP·Filed 2015·Granted May 24, 2016·0 cites·5 claims
- 2233US2015268169A1ICP Optical Emission SpectrometerHITACHI HIGH TECH SCIENCE CORP·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →