Inventor · disambiguated record
Ravi Ramaswami
Also filed as: RAMASWAMI RAVI · RAMASWAMI RAVI K · RAMASWAMI RAVI KARAPATTI
13 granted patents·1 pending application·422 citations·filing 1999–2013
92Inventor score
Files withHEWLETT PACKARD CO3AGERE SYSTEMS INC2APPLE INC2HEWLETT PACKARD DEVELOPMENT CO2RAMASWAMI RAVI K2
Top patents by PatentIndex Score
14 records- 0198US6482574B1Droplet plate architecture in ink-jet printheadsHEWLETT PACKARD CO·Filed 2000·Granted Nov 19, 2002·140 cites·9 claims
- 0297US6315384B1Thermal inkjet printhead and high-efficiency polycrystalline silicon resistor system for use thereinHEWLETT PACKARD CO·Filed 2000·Granted Nov 13, 2001·152 cites·20 claims
- 0387US8847777B2Voltage supply droop detectorRAMASWAMI RAVI K·Filed 2011·Granted Sep 30, 2014·15 cites·24 claims
- 0484US6839797B2Multi-bank scheduling to improve performance on tree accesses in a DRAM based random access memory subsystemAGERE SYSTEMS INC·Filed 2001·Granted Jan 4, 2005·39 cites·13 claims
- 0578US6944731B2Dynamic random access memory system with bank conflict avoidance featureAGERE SYSTEMS INC·Filed 2001·Granted Sep 13, 2005·26 cites·18 claims
- 0675US6682874B2Droplet plate architectureHEWLETT PACKARD DEVELOPMENT CO·Filed 2002·Granted Jan 27, 2004·12 cites·8 claims
- 0773US8797082B2Apparatus and methods for clock characterizationAPPLE INC·Filed 2012·Granted Aug 5, 2014·4 cites·14 claims
- 0868US7650550B2Over temperature detection apparatus and method thereofGLOBALFOUNDRIES INC·Filed 2007·Granted Jan 19, 2010·7 cites·20 claims
- 0963US6267471B1High-efficiency polycrystalline silicon resistor system for use in a thermal inkjet printheadHEWLETT PACKARD CO·Filed 1999·Granted Jul 31, 2001·21 cites·19 claims
- 1061US6837572B2Droplet plate architectureHEWLETT PACKARD DEVELOPMENT CO·Filed 2003·Granted Jan 4, 2005·6 cites·6 claims
- 1143US8793545B2Apparatus and method for clock glitch detection during at-speed testingRAMASWAMI RAVI K·Filed 2012·Granted Jul 29, 2014·0 cites·20 claims
- 1240US2015046763A1Apparatus and Method for Controlling Internal Test ControllersAPPLE INC·Filed 2013·Application pending·0 cites
- 1338US8593196B2Test circuit and methods for speed characterizationRAMASWAMI RAVI KARAPATTI·Filed 2012·Granted Nov 26, 2013·0 cites·25 claims
- 1438US7609190B1Device and method for testing of digital-to-analog converterADVANCED MICRO DEVICES INC·Filed 2008·Granted Oct 27, 2009·0 cites·20 claims
Join the waitlist — get patent alerts
Get an alert when Ravi Ramaswami files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →