Inventor · disambiguated record
Ulrich Lambert
Also filed as: LAMBERT ULLRICH · LAMBERT ULRICH
7 granted patents·262 citations·filing 1997–2011
86Inventor score
Top patents by PatentIndex Score
7 records- 0190US5935320AProcess for producing silicon semiconductor wafers with low defect densityWACKER SILTRONIC HALBLEITERMAT·Filed 1997·Granted Aug 10, 1999·148 cites·4 claims
- 0288US8088219B2Monocrystalline semiconductor wafer comprising defect-reduced regions and method for producing itKNERER DIETER·Filed 2007·Granted Jan 3, 2012·22 cites·7 claims
- 0388US6228164B1Process for producing a single crystalWACKER SILTRONIC HALBLEITERMAT·Filed 1999·Granted May 8, 2001·67 cites·26 claims
- 0480US6946030B2Method for the production of a silica glass crucible with crystalline regions from a porous silica glass green bodyWACKER CHEMIE GMBH·Filed 2002·Granted Sep 20, 2005·12 cites·20 claims
- 0575US7387676B2Process for producing silicon semiconductor wafers with defined defect properties, and silicon semiconductor wafers having these defect propertiesSILTRONIC AG·Filed 2006·Granted Jun 17, 2008·5 cites·13 claims
- 0658US7122865B2SOI wafer and process for producing itSILTRONIC AG·Filed 2004·Granted Oct 17, 2006·8 cites·11 claims
- 0747US8216361B2Monocrystalline semiconductor wafer comprising defect-reduced regions and method for producing itKNERER DIETER·Filed 2011·Granted Jul 10, 2012·0 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →