Inventor · disambiguated record
Yukio Kenbou
Also filed as: KENBOU YUKIO
9 granted patents·1 pending application·80 citations·filing 2001–2014
88Inventor score
Files withHITACHI HIGH TECH CORP2HITACHI KENKI FINE TECH CO LTD2HITACHI LTD2HITACHI HIGH TECH ELECT ENG CO1HITACHI KENKI FINETECH CO LTD1
Top patents by PatentIndex Score
10 records- 0191US6894302B2Surface inspection apparatus and method thereofHITACHI HIGH TECH ELECT ENG CO·Filed 2001·Granted May 17, 2005·35 cites·7 claims
- 0289US7242016B2Surface inspection apparatus and method thereofHITACHI HIGH TECH CORP·Filed 2005·Granted Jul 10, 2007·11 cites·15 claims
- 0388US7417244B2Surface inspection apparatus and method thereofHITACHI LTD·Filed 2007·Granted Aug 26, 2008·9 cites·18 claims
- 0484US7952085B2Surface inspection apparatus and method thereofHITACHI LTD·Filed 2008·Granted May 31, 2011·6 cites·17 claims
- 0564US9551670B2Surface inspection apparatus and method thereofHITACHI HIGH TECH CORP·Filed 2014·Granted Jan 24, 2017·0 cites·11 claims
- 0657US7333191B2Scanning probe microscope and measurement method using the sameHITACHI KENKI FINETECH CO LTD·Filed 2004·Granted Feb 19, 2008·11 cites·10 claims
- 0755US8729514B2Surface inspection apparatus and method thereofISHIMARU ICHIRO·Filed 2011·Granted May 20, 2014·0 cites·19 claims
- 0846US7388199B2Probe manufacturing method, probe, and scanning probe microscopeHITACHI KENKI FINE TECH CO LTD·Filed 2004·Granted Jun 17, 2008·5 cites·17 claims
- 0943US7350404B2Scanning type probe microscope and probe moving control method thereforHITACHI KENKI FINE TECH CO LTD·Filed 2004·Granted Apr 1, 2008·3 cites·4 claims
- 1034US2008236259A1Method of Control of Probe Scan and Apparatus for Controlling Probe Scan of Scanning Probe MicroscopeKURENUMA TOORU·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →