Inventor · disambiguated record
Hidetoshi Koike
Also filed as: KOIKE HIDETOSHI
31 granted patents·7 pending applications·576 citations·filing 1994–2015
97Inventor score
Top patents by PatentIndex Score
38 records- 0193US8138533B2Semiconductor device with an electrode as an alignment mark, and method of manufacturing the sameKOIKE HIDETOSHI·Filed 2009·Granted Mar 20, 2012·29 cites·15 claims
- 0293US6392300B1Semiconductor device having an alignment mark formed on the uppermost layer of a multilayer wireTOSHIBA KK·Filed 2000·Granted May 21, 2002·82 cites·17 claims
- 0393US5578518AMethod of manufacturing a trench isolation having round cornersTOSHIBA KK·Filed 1994·Granted Nov 26, 1996·159 cites·12 claims
- 0490US8084798B2Semiconductor device having image sensorKOIKE HIDETOSHI·Filed 2008·Granted Dec 27, 2011·12 cites·10 claims
- 0590US6519919B1Method and apparatus for manufacturing pressurized packaging bodyTOYO SEIKAN KAISHA LTD·Filed 1999·Granted Feb 18, 2003·70 cites·36 claims
- 0689US7205637B2Semiconductor device with a multilevel interconnection connected to a guard ring and alignment markTOSHIBA KK·Filed 2006·Granted Apr 17, 2007·13 cites·4 claims
- 0783US7161231B2Semiconductor device which prevents peeling of low-permittivity film by using multilevel interconnectionTOSHIBA KK·Filed 2003·Granted Jan 9, 2007·24 cites·8 claims
- 0882US7205636B2Semiconductor device with a multilevel interconnection connected to a guard ringTOSHIBA KK·Filed 2006·Granted Apr 17, 2007·7 cites·8 claims
- 0980US8659060B2Solid-state imaging device and manufacturing method thereofKOIKE HIDETOSHI·Filed 2012·Granted Feb 25, 2014·2 cites·13 claims
- 1080US8488028B2Solid state imaging device including a pixel region, a black reference region, and a dummy regionKOIKE HIDETOSHI·Filed 2010·Granted Jul 16, 2013·2 cites·9 claims
- 1180US6030876ASemiconductor device and method of manufacture thereofTOSHIBA KK·Filed 1998·Granted Feb 29, 2000·39 cites·9 claims
- 1276US6649997B2Semiconductor device having fuses or anti-fusesTOSHIBA KK·Filed 1999·Granted Nov 18, 2003·48 cites·18 claims
- 1368US6989560B2Semiconductor device and method of fabricating the sameTOSHIBA KK·Filed 2003·Granted Jan 24, 2006·11 cites·10 claims
- 1465US9110856B2Interface control apparatus, data storage apparatus and method for interface controlTOSHIBA KK·Filed 2013·Granted Aug 18, 2015·2 cites·14 claims
- 1564US9048156B2Semiconductor image pickup deviceKOIKE HIDETOSHI·Filed 2011·Granted Jun 2, 2015·1 cites·19 claims
- 1664US8334555B2Semiconductor device having image sensorKOIKE HIDETOSHI·Filed 2011·Granted Dec 18, 2012·0 cites·5 claims
- 1764US6667503B2Semiconductor trench capacitorTOSHIBA KK·Filed 2002·Granted Dec 23, 2003·10 cites·6 claims
- 1863USRE43909ESemiconductor device with a multilevel interconnection connected to a guard ringTOSHIBA KK·Filed 2009·Granted Jan 8, 2013·1 cites·42 claims
- 1961US9171974B2Semiconductor device and method of manufacturing the sameTOSHIBA KK·Filed 2013·Granted Oct 27, 2015·0 cites·9 claims
- 2061US5851865AMethod of manufacturing semiconductor device having mask layer forming step for ion implantationTOSHIBA KK·Filed 1996·Granted Dec 22, 1998·25 cites·35 claims
- 2160US5874325AMethod of manufacturing semiconductor device with gettering and isolationTOSHIBA KK·Filed 1996·Granted Feb 23, 1999·24 cites·20 claims
- 2259US7268068B2Semiconductor device and manufacturing method thereofTOSHIBA KK·Filed 2005·Granted Sep 11, 2007·1 cites·4 claims
- 2359US2015069477A1Solid-state imaging device and manufacturing method thereofTOSHIBA KK·Filed 2014·Application pending·0 cites
- 2457US8816413B2Semiconductor imaging device with which semiconductor elements of pixel area and other areas has same characteristicsKOIKE HIDETOSHI·Filed 2010·Granted Aug 26, 2014·0 cites·14 claims
- 2557US6989577B2Semiconductor device having multiple insulation layersTOSHIBA KK·Filed 2001·Granted Jan 24, 2006·6 cites·7 claims
- 2655US8399946B1Solid-state imaging device and manufacturing method thereofKOIKE HIDETOSHI·Filed 2012·Granted Mar 19, 2013·0 cites·11 claims
- 2754US8907387B2Solid-state imaging device and manufacturing method thereofKOIKE HIDETOSHI·Filed 2012·Granted Dec 9, 2014·0 cites·6 claims
- 2853US9472591B2Semiconductor image pickup deviceTOSHIBA KK·Filed 2015·Granted Oct 18, 2016·0 cites·11 claims
- 2952US9240430B2Semiconductor image pickup deviceTOSHIBA KK·Filed 2015·Granted Jan 19, 2016·0 cites·19 claims
- 3052US8314470B2Solid-state imaging device and manufacturing method thereofKOIKE HIDETOSHI·Filed 2010·Granted Nov 20, 2012·0 cites·20 claims
- 3148US9201611B2Interface control apparatus, data storage apparatus and interface control methodTOSHIBA KK·Filed 2013·Granted Dec 1, 2015·0 cites·18 claims
- 3246US6531736B1Semiconductor device and method of manufacturing thereofTOSHIBA KK·Filed 1999·Granted Mar 11, 2003·8 cites·16 claims
- 3346US2014281677A1Error correction method and device and information storing deviceTOSHIBA KK·Filed 2013·Application pending·0 cites
- 3444US2007170544A1Semiconductor device with metal fusesTOSHIBA KK·Filed 2007·Application pending·0 cites
- 3543US2013198586A1Data storage control apparatus, data storage apparatus and data storage method in the sameKOIKE HIDETOSHI·Filed 2012·Application pending·0 cites
- 3639US2012303970A1Data storage apparatus, storage control apparatus and data recovery methodKOIKE HIDETOSHI·Filed 2012·Application pending·0 cites
- 3739US2004245601A1Semiconductor deviceTOSHIBA KK·Filed 2004·Application pending·0 cites
- 3834US2002096726A1Semiconductor device and manufacturing method thereofTOSHIBA KK·Filed 2001·Application pending·0 cites
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