Inventor · disambiguated record
Samee Ur Rehman
Also filed as: REHMAN SAMEE UR
9 granted patents·3 pending applications·5 citations·filing 2018–2022
78Inventor score
Files withASML NETHERLANDS BV12
Top patents by PatentIndex Score
12 records- 0191US12032299B2Metrology method and associated metrology and lithographic apparatusesASML NETHERLANDS BV·Filed 2020·Granted Jul 9, 2024·2 cites·25 claims
- 0280US10551172B2Metrology method, apparatus and computer programASML NETHERLANDS BV·Filed 2018·Granted Feb 4, 2020·2 cites·20 claims
- 0378US10310389B2Method of measuring, device manufacturing method, metrology apparatus, and lithographic systemASML NETHERLANDS BV·Filed 2018·Granted Jun 4, 2019·1 cites·20 claims
- 0466US11604419B2Method of determining information about a patterning process, method of reducing error in measurement data, method of calibrating a metrology process, method of selecting metrology targetsASML NETHERLANDS BV·Filed 2021·Granted Mar 14, 2023·0 cites·20 claims
- 0563US12189305B2Metrology method and apparatus and computer programASML NETHERLANDS BV·Filed 2021·Granted Jan 7, 2025·0 cites·14 claims
- 0657US2024184221A1Alignment method and associated alignment and lithographic apparatusesASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
- 0756US11754931B2Method for determining corrections for lithographic apparatusASML NETHERLANDS BV·Filed 2020·Granted Sep 12, 2023·0 cites·20 claims
- 0856US11022897B2Method of determining information about a patterning process, method of reducing error in measurement data, method of calibrating a metrology process, method of selecting metrology targetsASML NETHERLANDS BV·Filed 2018·Granted Jun 1, 2021·0 cites·20 claims
- 0946US10585354B2Method of optimizing a metrology processASML NETHERLANDS BV·Filed 2019·Granted Mar 10, 2020·0 cites·20 claims
- 1044US10585048B2Method of determining a value of a parameter of interest of a target formed by a patterning processASML NETHERLANDS BV·Filed 2019·Granted Mar 10, 2020·0 cites·21 claims
- 1143US2022082944A1Method for metrology optimizationASML NETHERLANDS BV·Filed 2019·Application pending·0 cites
- 1242US2020104676A1Providing a Trained Network and Determining a Characteristic of a Physical SystemASML NETHERLANDS BV·Filed 2019·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →