Inventor · disambiguated record
Simon Philip Spencer Hastings
Also filed as: HASTINGS SIMON PHILIP SPENCER
12 granted patents·16 citations·filing 2017–2021
85Inventor score
Files withASML NETHERLANDS BV12
Top patents by PatentIndex Score
12 records- 0190US11947266B2Method for controlling a manufacturing process and associated apparatusesASML NETHERLANDS BV·Filed 2019·Granted Apr 2, 2024·5 cites·20 claims
- 0287US12044980B2Method of manufacturing devicesASML NETHERLANDS BV·Filed 2019·Granted Jul 23, 2024·3 cites·20 claims
- 0382US11803127B2Method for determining root cause affecting yield in a semiconductor manufacturing processASML NETHERLANDS BV·Filed 2019·Granted Oct 31, 2023·3 cites·20 claims
- 0474US12055904B2Method to predict yield of a device manufacturing processASML NETHERLANDS BV·Filed 2019·Granted Aug 6, 2024·2 cites·20 claims
- 0574US11086229B2Method to predict yield of a device manufacturing processASML NETHERLANDS BV·Filed 2018·Granted Aug 10, 2021·1 cites·24 claims
- 0674US10466594B2Method of measuring a structure, inspection apparatus, lithographic system and device manufacturing methodASML NETHERLANDS BV·Filed 2017·Granted Nov 5, 2019·1 cites·17 claims
- 0773US10598483B2Metrology method, apparatus and computer programASML NETHERLANDS BV·Filed 2017·Granted Mar 24, 2020·1 cites·18 claims
- 0870US11714357B2Method to predict yield of a device manufacturing processASML NETHERLANDS BV·Filed 2021·Granted Aug 1, 2023·0 cites·20 claims
- 0964US11022892B2Method of measuring a structure, inspection apparatus, lithographic system and device manufacturing methodASML NETHERLANDS BV·Filed 2019·Granted Jun 1, 2021·0 cites·22 claims
- 1056US11754931B2Method for determining corrections for lithographic apparatusASML NETHERLANDS BV·Filed 2020·Granted Sep 12, 2023·0 cites·20 claims
- 1150US11281110B2Methods using fingerprint and evolution analysisASML NETHERLANDS BV·Filed 2019·Granted Mar 22, 2022·0 cites·22 claims
- 1244US12169366B2Voltage contrast metrology markASML NETHERLANDS BV·Filed 2018·Granted Dec 17, 2024·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →