Inventor · disambiguated record
Chih-Ting Sun
Also filed as: SUN CHIH-TING
9 granted patents·22 citations·filing 2017–2023
85Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD9
Top patents by PatentIndex Score
9 records- 0193US10283496B2Integrated circuit filler and method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted May 7, 2019·10 cites·20 claims
- 0291US10679980B2Integrated circuit filler and method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Jun 9, 2020·5 cites·20 claims
- 0390US11762302B2Integrated circuit overlay test patterns and method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Sep 19, 2023·2 cites·20 claims
- 0489US11309307B2Integrated circuit filler and method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Apr 19, 2022·2 cites·20 claims
- 0587US10388645B2Integrated circuit filler and method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Aug 20, 2019·3 cites·20 claims
- 0684US12183729B2Integrated circuit filler and method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Dec 31, 2024·0 cites·20 claims
- 0778US11776948B2Integrated circuit filler and method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Oct 3, 2023·0 cites·20 claims
- 0876US12271116B2Method of measuring mask overlay using test patternsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Apr 8, 2025·0 cites·20 claims
- 0956US11016398B2Integrated circuit overlay test patterns and method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted May 25, 2021·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →