Inventor · disambiguated record
Hitoshi Sugahara
Also filed as: SUGAHARA HITOSHI
10 granted patents·3 pending applications·15 citations·filing 2008–2022
82Inventor score
Top patents by PatentIndex Score
13 records- 0188US10558127B2Exposure condition evaluation deviceHITACHI HIGH TECH CORP·Filed 2015·Granted Feb 11, 2020·4 cites·18 claims
- 0275US9990708B2Pattern-measuring apparatus and semiconductor-measuring systemHITACHI HIGH TECH CORP·Filed 2014·Granted Jun 5, 2018·3 cites·5 claims
- 0373US8942464B2Pattern measuring apparatus, and pattern measuring method and programSHIBAHARA TAKUMA·Filed 2011·Granted Jan 27, 2015·4 cites·9 claims
- 0471US10445875B2Pattern-measuring apparatus and semiconductor-measuring systemHITACHI HIGH TECH CORP·Filed 2018·Granted Oct 15, 2019·1 cites·7 claims
- 0569US11836906B2Image processing system and computer program for performing image processingHITACHI HIGH TECH CORP·Filed 2021·Granted Dec 5, 2023·0 cites·6 claims
- 0667US11176405B2Image processing system and computer program for performing image processingHITACHI HIGH TECH CORP·Filed 2018·Granted Nov 16, 2021·1 cites·11 claims
- 0766US8959461B2Pattern measurement device and pattern measurement methodSHIBAHARA TAKUMA·Filed 2012·Granted Feb 17, 2015·2 cites·11 claims
- 0850US2025140516A1Recipe Creating System, Length Measurement System, and Recipe Creating MethodHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 0946US11443917B2Image generation method, non-transitory computer-readable medium, and systemHITACHI HIGH TECH CORP·Filed 2020·Granted Sep 13, 2022·0 cites·6 claims
- 1037US2008226158A1Data Processor and Data Processing MethodHITACHI HIGH TECH CORP·Filed 2008·Application pending·0 cites
- 1137US2011150318A1Data processing system, data processing method, and inspection assist systemFUNAKOSHI TOMOHIRO·Filed 2009·Application pending·0 cites
- 1235US10937628B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2017·Granted Mar 2, 2021·0 cites·6 claims
- 1333US10190875B2Pattern measurement condition setting device and pattern measuring deviceHITACHI HIGH TECH CORP·Filed 2015·Granted Jan 29, 2019·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →