Inventor · disambiguated record
Tomoharu Obuki
Also filed as: OBUKI TOMOHARU
4 granted patents·1 pending application·14 citations·filing 2008–2011
71Inventor score
Top patents by PatentIndex Score
5 records- 0182US7663104B2Specimen inspection equipment and how to make electron beam absorbed current imagesHITACHI HIGH TECH CORP·Filed 2008·Granted Feb 16, 2010·6 cites·8 claims
- 0270US7989766B2Sample inspection apparatusHITACHI HIGH TECH CORP·Filed 2009·Granted Aug 2, 2011·2 cites·17 claims
- 0369US8178840B2Specimen inspection equipment and how to make the electron beam absorbed current imagesOBUKI TOMOHARU·Filed 2010·Granted May 15, 2012·2 cites·5 claims
- 0461US8816712B2Inspection deviceNAKAMURA MITSUHIRO·Filed 2009·Granted Aug 26, 2014·4 cites·9 claims
- 0531US2013119999A1Specimen Testing Device and Method for Creating Absorbed Current ImageOBUKI TOMOHARU·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →