Inventor · disambiguated record
Kenji Mitomo
Also filed as: MITOMO KENJI
6 granted patents·86 citations·filing 2001–2010
81Inventor score
Technology areasG01N
Top patents by PatentIndex Score
6 records- 0190US6731384B2Apparatus for detecting foreign particle and defect and the same methodHITACHI LTD·Filed 2001·Granted May 4, 2004·44 cites·18 claims
- 0285US6798504B2Apparatus and method for inspecting surface of semiconductor wafer or the likeHITACHI HIGH TECH ELECT ENG CO·Filed 2001·Granted Sep 28, 2004·32 cites·13 claims
- 0380US7616299B2Surface inspection method and surface inspection apparatusHITACHI HIGH TECH CORP·Filed 2007·Granted Nov 10, 2009·6 cites·3 claims
- 0476US7864310B2Surface inspection method and surface inspection apparatusHITACHI HIGH TECH CORP·Filed 2009·Granted Jan 4, 2011·4 cites·5 claims
- 0552US8804108B2Inspection method and inspection apparatusMITOMO KENJI·Filed 2009·Granted Aug 12, 2014·0 cites·16 claims
- 0640US8949043B2Surface inspecting apparatus and method for calibrating sameOKA KENJI·Filed 2010·Granted Feb 3, 2015·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →