Inventor · disambiguated record
Mohamed M. Hafed
Also filed as: HAFED MOHAMED · HAFED MOHAMED M
9 granted patents·2 pending applications·108 citations·filing 2001–2011
88Inventor score
Top patents by PatentIndex Score
11 records- 0189US7681091B2Signal integrity measurement systems and methods using a predominantly digital time-base generatorDFT MICROSYSTEMS INC·Filed 2007·Granted Mar 16, 2010·17 cites·72 claims
- 0283US7813297B2High-speed signal testing system having oscilloscope functionalityDFT MICROSYSTEMS INC·Filed 2007·Granted Oct 12, 2010·14 cites·24 claims
- 0383US7315574B2System and method for generating a jittered test signalDFT MICROSYSTEMS INC·Filed 2005·Granted Jan 1, 2008·16 cites·17 claims
- 0482US6931579B2Integrated excitation/extraction system for test and measurementUNIV MCGILL·Filed 2001·Granted Aug 16, 2005·28 cites·41 claims
- 0581US7917319B2Systems and methods for testing and diagnosing delay faults and for parametric testing in digital circuitsDFT MICROSYSTEMS INC·Filed 2008·Granted Mar 29, 2011·10 cites·10 claims
- 0674US8244492B2Methods of parametric testing in digital circuitsHAFED MOHAMED M·Filed 2011·Granted Aug 14, 2012·3 cites·10 claims
- 0770US8327204B2High-speed transceiver tester incorporating jitter injectionHAFED MOHAMED M·Filed 2006·Granted Dec 4, 2012·6 cites·26 claims
- 0863US7242209B2System and method for testing integrated circuitsDFT MICROSYSTEMS INC·Filed 2004·Granted Jul 10, 2007·13 cites·58 claims
- 0947US6914548B2Programmable DC voltage generatorUNIV MCGILL·Filed 2001·Granted Jul 5, 2005·1 cites·31 claims
- 1045US2010138695A1Signal Integrity Measurement Systems and Methods Using a Predominantly Digital Time-Base GeneratorDFT MICROSYSTEMS INC·Filed 2010·Application pending·0 cites
- 1133US2008192814A1System and Method for Physical-Layer Testing of High-Speed Serial Links in their Mission EnvironmentsDFT MICROSYSTEMS INC·Filed 2008·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →