Inventor · disambiguated record
Kang-Ho Ahn
Also filed as: AHN KANG H · AHN KANG-HO
16 granted patents·7 pending applications·531 citations·filing 1987–2023
94Inventor score
Files withAHN KANG HO9HYUNDAI CALIBRATION & CERTIFIC4IUCF HYU ERICA CAMPUS2UNIV MINNESOTA2A & P SCIENCE CO LTD1
Top patents by PatentIndex Score
23 records- 0194US6471753B1Device for collecting dust using highly charged hyperfine liquid dropletsACE LAB INC·Filed 2000·Granted Oct 29, 2002·99 cites·3 claims
- 0294US4817652ASystem for surface and fluid cleaningUNIV MINNESOTA·Filed 1987·Granted Apr 4, 1989·151 cites·7 claims
- 0390US7724368B2Condensation particle counterAHN KANG HO·Filed 2008·Granted May 25, 2010·18 cites·5 claims
- 0490US4962776AProcess for surface and fluid cleaningUNIV MINNESOTA·Filed 1988·Granted Oct 16, 1990·98 cites·32 claims
- 0587US7719683B2Condensation particle counterAHN KANG HO·Filed 2008·Granted May 18, 2010·11 cites·5 claims
- 0687US7605910B2Particle measuring system and methodAHN KANG HO·Filed 2007·Granted Oct 20, 2009·14 cites·15 claims
- 0784US8072598B2Condensation particle counterAHN KANG HO·Filed 2008·Granted Dec 6, 2011·8 cites·8 claims
- 0883US7334602B2Apparatus for controlling flow rate of gases used in semiconductor device by differential pressureHYUNDAI CALIBRATION & CERTIFIC·Filed 2004·Granted Feb 26, 2008·30 cites·6 claims
- 0982US7471076B2Apparatus for measuring numbers of particles and method thereofHYUNDAI CALIBRATION & CERTIFIC·Filed 2005·Granted Dec 30, 2008·9 cites·5 claims
- 1081US5267017AMethod of particle analysis on a mirror waferAPPLIED MATERIALS INC·Filed 1992·Granted Nov 30, 1993·48 cites·18 claims
- 1178US6980284B2Condensation particle counterHYUNDAI CALIBRATION & CERTIFIC·Filed 2001·Granted Dec 27, 2005·26 cites·18 claims
- 1271US6860434B2Apparatus for manufacturing ultra-fine particles using electrospray device and method thereofFiled 2001·Granted Mar 1, 2005·17 cites·11 claims
- 1365US2025208018A1Condensation particle counter and system including sameAHN KANG HO·Filed 2023·Application pending·0 cites
- 1462US7347679B2Apparatus for manufacturing ultra-fine particles using electrospray device and method thereofAHN KANG HO·Filed 2005·Granted Mar 25, 2008·2 cites·4 claims
- 1552US7972567B2Apparatus for manufacturing ultra-fine particles using corona discharge and method thereofAHN KANG-HO·Filed 2005·Granted Jul 5, 2011·0 cites·18 claims
- 1646US10591397B2Apparatus and system for classifying particlesIUCF HYU ERICA CAMPUS·Filed 2015·Granted Mar 17, 2020·0 cites·14 claims
- 1743US10845347B2Particle sampling probe and fine dust measuring device using sameIUCF HYU ERICA CAMPUS·Filed 2016·Granted Nov 24, 2020·0 cites·6 claims
- 1843US2008280068A1Apparatus and Method for Manufacturing Ultra-Fine ParticlesAHN KANG-HO·Filed 2006·Application pending·0 cites
- 1942US2010135868A1Soft x-ray photoionization chargerHYUNDAI CALIBRATION & CERTIFIC·Filed 2008·Application pending·0 cites
- 2042US2008160905A1Exhaust unit, exhausting method, and semiconductor manufacturing facility with the exhaust unitKIM MOON-JEONG·Filed 2007·Application pending·0 cites
- 2141US2009054231A1Method for preparing nanostructured vanadia-titania catalysts useful for degrading chlorinated organic compounds by a flame spray processJURNG JONG SOO·Filed 2007·Application pending·0 cites
- 2240US2006163380A1High flow particles atomizerA & P SCIENCE CO LTD·Filed 2004·Application pending·0 cites
- 2338US2006072278A1Apparatus for manufacturing particles using corona discharge and method thereofAHN KANG-HO·Filed 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →