Inventor · disambiguated record
Ryan Major
Also filed as: MAJOR RYAN · MAJOR RYAN CHARLES
10 granted patents·2 pending applications·58 citations·filing 2009–2024
87Inventor score
Top patents by PatentIndex Score
12 records- 0192US8844366B2Three dimensional transducerWARREN ODEN LEE·Filed 2012·Granted Sep 30, 2014·28 cites·20 claims
- 0289US11237087B2Testing assembly including a multiple degree of freedom stageBRUKER NANO INC·Filed 2020·Granted Feb 1, 2022·2 cites·32 claims
- 0389US9472374B2Testing assembly including a multiple degree of freedom stageHYSITRON INC·Filed 2012·Granted Oct 18, 2016·11 cites·20 claims
- 0487US2025123192A1Testing assembly including a multiple degree of freedom stageBRUKER NANO INC·Filed 2024·Application pending·0 cites
- 0585US10663380B2Testing assembly including a multiple degree of freedom stageBRUKER NANO INC·Filed 2016·Granted May 26, 2020·3 cites·37 claims
- 0681US9335240B2Method of measuring an interaction forceHYSITRON INC·Filed 2012·Granted May 10, 2016·5 cites·24 claims
- 0777US9829417B2Environmental conditioning assembly for use in mechanical testing at micron or nano-scalesHYSITRON INC·Filed 2013·Granted Nov 28, 2017·4 cites·29 claims
- 0876US12140571B2Testing assembly including a multiple degree of freedom stageBRUKER NANO INC·Filed 2021·Granted Nov 12, 2024·0 cites·22 claims
- 0970US10241017B2High temperature heating systemBRUKER NANO INC·Filed 2012·Granted Mar 26, 2019·1 cites·15 claims
- 1068US9804072B2High temperature heating systemHYSITRON INC·Filed 2012·Granted Oct 31, 2017·1 cites·21 claims
- 1162US8738315B2Digital damping control of nanomechanical test instrumentsOH YUNJE·Filed 2009·Granted May 27, 2014·3 cites·24 claims
- 1233US2015075264A1Microscope objective mechanical testing instrumentHYSITRON INC·Filed 2013·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →