Inventor · disambiguated record
Peter Mccann
Also filed as: MCCANN PETER · MCCANN PETER R
13 granted patents·2 pending applications·302 citations·filing 2000–2019
93Inventor score
Top patents by PatentIndex Score
15 records- 0194US6836135B2Optical testing deviceCASCADE MICROTECH INC·Filed 2002·Granted Dec 28, 2004·60 cites·24 claims
- 0294US6771090B2Indexing rotatable chuck for a probe stationCASCADE MICROTECH INC·Filed 2002·Granted Aug 3, 2004·67 cites·14 claims
- 0393US6885197B2Indexing rotatable chuck for a probe stationCASCADE MICROTECH INC·Filed 2004·Granted Apr 26, 2005·50 cites·3 claims
- 0493US6483336B1Indexing rotatable chuck for a probe stationCASCADE MICROTECH INC·Filed 2000·Granted Nov 19, 2002·59 cites·6 claims
- 0586US7298536B2Fiber optic wafer probeCASCADE MICROTECH INC·Filed 2005·Granted Nov 20, 2007·14 cites·6 claims
- 0681US7420381B2Double sided probing structuresCASCADE MICROTECH INC·Filed 2005·Granted Sep 2, 2008·11 cites·12 claims
- 0780US10459006B2Probe systems and methodsCASCADE MICROTECH INC·Filed 2017·Granted Oct 29, 2019·2 cites·14 claims
- 0878US8013623B2Double sided probing structuresCASCADE MICROTECH INC·Filed 2008·Granted Sep 6, 2011·9 cites·5 claims
- 0975US11047879B2Probe systems and methodsFORMFACTOR INC·Filed 2019·Granted Jun 29, 2021·1 cites·17 claims
- 1075US7876115B2Chuck for holding a device under testCASCADE MICROTECH INC·Filed 2009·Granted Jan 25, 2011·7 cites·4 claims
- 1168US7492172B2Chuck for holding a device under testCASCADE MICROTECH INC·Filed 2004·Granted Feb 17, 2009·12 cites·6 claims
- 1261US7268533B2Optical testing deviceCASCADE MICROTECH INC·Filed 2004·Granted Sep 11, 2007·7 cites·4 claims
- 1352US6970634B2Fiber optic wafer probeCASCADE MICROTECH INC·Filed 2001·Granted Nov 29, 2005·3 cites·73 claims
- 1450US2005127927A1Indexing rotatable chuck for a probe stationCASCADE MICROTECH INC·Filed 2005·Application pending·0 cites
- 1544US2007273387A1Optical testing deviceCASCADE MICROTECH INC·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →