Inventor · disambiguated record
Susumu Kuwabara
Also filed as: KUWABARA SUSUMU
13 granted patents·2 pending applications·205 citations·filing 1992–2024
90Inventor score
Top patents by PatentIndex Score
15 records- 0195US6596610B1Method for reclaiming delaminated wafer and reclaimed delaminated waferSHINETSU HANDOTAI KK·Filed 2000·Granted Jul 22, 2003·108 cites·1 claims
- 0288US6846718B1Method for producing SOI wafer and SOI waferSHINETSU HANDOTAI KK·Filed 2000·Granted Jan 25, 2005·42 cites·3 claims
- 0380US6720640B2Method for reclaiming delaminated wafer and reclaimed delaminated waferSHINETSU HANDOTAI KK·Filed 2003·Granted Apr 13, 2004·25 cites·12 claims
- 0470US8741741B2Method for designing SOI wafer and method for manufacturing SOI waferKUWABARA SUSUMU·Filed 2011·Granted Jun 3, 2014·3 cites·4 claims
- 0568US9279665B2Method for measuring film thickness distributionSHINETSU HANDOTAI KK·Filed 2012·Granted Mar 8, 2016·2 cites·12 claims
- 0666US8976369B2Method for evaluating thin-film-formed waferKUWABARA SUSUMU·Filed 2011·Granted Mar 10, 2015·2 cites·18 claims
- 0760US2024304493A1Method for making radio frequency silicon-on-insulator (rfsoi) structure including a superlatticeATOMERA INC·Filed 2024·Application pending·0 cites
- 0859US8311771B2Inspection method of SOI waferKUWABARA SUSUMU·Filed 2010·Granted Nov 13, 2012·1 cites·18 claims
- 0959US7176102B2Method for producing SOI wafer and SOI waferSHINETSU HANDOTAI KK·Filed 2004·Granted Feb 13, 2007·8 cites·3 claims
- 1049US8497187B2Method for manufacturing SOI wafer and SOI waferOKA SATOSHI·Filed 2009·Granted Jul 30, 2013·0 cites·4 claims
- 1149US5321264AMethod for evaluating surface state of silicon waferSHINETSU HANDOTAI KK·Filed 1992·Granted Jun 14, 1994·14 cites·8 claims
- 1242US10115580B2Method for manufacturing an SOI waferSHINETSU HANDOTAI KK·Filed 2015·Granted Oct 30, 2018·0 cites·22 claims
- 1341US11965730B2Method for measuring film thickness distribution of wafer with thin filmsSHINETSU HANDOTAI KK·Filed 2020·Granted Apr 23, 2024·0 cites·8 claims
- 1439US8981291B2Method for measuring film thickness of SOI layer of SOI waferKUWABARA SUSUMU·Filed 2012·Granted Mar 17, 2015·0 cites·5 claims
- 1536US2012301976A1Method for designing soi wafer and method for manufacturing soi waferKUWABARA SUSUMU·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →