Inventor · disambiguated record
Suhas Narayan Ketkar
Also filed as: KETKAR SUHAS · KETKAR SUHAS N · KETKAR SUHAS NARAYAN
9 granted patents·5 pending applications·147 citations·filing 1987–2024
89Inventor score
Top patents by PatentIndex Score
14 records- 0179US8129577B2Process and system for providing acetyleneMAYKUT TIMOTHY JOHN·Filed 2009·Granted Mar 6, 2012·2 cites·5 claims
- 0279US6518581B1Apparatus for control of gas flow into a mass spectrometer using a series of small orificesAIR PROD & CHEM·Filed 2000·Granted Feb 11, 2003·19 cites·27 claims
- 0378US6686999B2Method of using an aerosol to calibrate spectrometersAIR PROD & CHEM·Filed 2001·Granted Feb 3, 2004·17 cites·19 claims
- 0476US8915992B2Process and system for providing acetyleneMAYKUT TIMOTHY JOHN·Filed 2012·Granted Dec 23, 2014·2 cites·5 claims
- 0576US6639214B1Method of improving the performance of an ion mobility spectrometer used to detect trace atmospheric impurities in gasesAIR PROD & CHEM·Filed 2000·Granted Oct 28, 2003·17 cites·9 claims
- 0676US2025079198A1Systems and methods for recovering organic contaminants from semiconducting wafersELEMENTAL SCIENTIFIC INC·Filed 2024·Application pending·0 cites
- 0776US2025079145A1Systems and methods for recovering organic contaminants from semiconducting wafersELEMENTAL SCIENTIFIC INC·Filed 2024·Application pending·0 cites
- 0876US2025076160A1Systems and methods for recovering organic contaminants from semiconducting wafersELEMENTAL SCIENTIFIC INC·Filed 2024·Application pending·0 cites
- 0975US4814613ACollision cell for triple quadrupole tandem mass spectrometryEXTREL CORP·Filed 1987·Granted Mar 21, 1989·20 cites·20 claims
- 1073US5661225ADynamic dilution systemAIR PROD & CHEM·Filed 1996·Granted Aug 26, 1997·46 cites·10 claims
- 1163US6606899B1Total impurity monitor for gasesAIR PROD & CHEM·Filed 2000·Granted Aug 19, 2003·6 cites·19 claims
- 1254US5360467AMethod of separating and detecting impurities using a fractional concentration detectorAIR PROD & CHEM·Filed 1993·Granted Nov 1, 1994·18 cites·16 claims
- 1342US2007261559A1Analysis of a reactive gas such as silane for particle generating impuritiesMAROULIS PETER J·Filed 2006·Application pending·0 cites
- 1434US2012244715A1High-selectivity etching system and methodLEBOUITZ KYLE S·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →