Inventor · disambiguated record
Woo-Seop Jeong
Also filed as: JEONG WOO-SEOP
23 granted patents·2 pending applications·422 citations·filing 1996–2011
96Inventor score
Top patents by PatentIndex Score
25 records- 0195US6707723B2Data input circuits and methods of inputting data for a synchronous semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Mar 16, 2004·105 cites·24 claims
- 0285US8198627B2Semiconductor device with test pads and pad connection unitJEONG WOO-SEOP·Filed 2010·Granted Jun 12, 2012·8 cites·17 claims
- 0385US7834350B2Semiconductor device with test pads and pad connection unitSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Nov 16, 2010·8 cites·19 claims
- 0485US6326815B1Sense amplifier of semiconductor integrated circuitSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Dec 4, 2001·32 cites·32 claims
- 0584US6151270AIntegrated circuit memory devices having programmable latency periods and methods of operating sameSAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted Nov 21, 2000·58 cites·16 claims
- 0684US5673225AWord line voltage boosting circuit and method thereofSAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted Sep 30, 1997·55 cites·9 claims
- 0782US8638626B2Row address control circuit semiconductor memory device including the same and method of controlling row addressYANG HUI-KAP·Filed 2011·Granted Jan 28, 2014·11 cites·18 claims
- 0872US7724574B2Semiconductor memory device and data write and read method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted May 25, 2010·8 cites·17 claims
- 0972US7518409B2Input stage of semiconductor device with multiple pads of common function, and multi-chip package having the sameSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Apr 14, 2009·6 cites·27 claims
- 1068US6476646B2Sense amplifier of semiconductor integrated circuitSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Nov 5, 2002·13 cites·20 claims
- 1168US6192429B1Memory device having a controller capable of disabling data input/output mask (DQM) input buffer during portions of a read operation and a write operationSAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted Feb 20, 2001·26 cites·20 claims
- 1262US7782688B2Semiconductor memory device and test method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Aug 24, 2010·2 cites·22 claims
- 1360US5835444AMethod for controlling data output buffer for use in operation at high frequency of synchronous memorySAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted Nov 10, 1998·19 cites·2 claims
- 1459US6154415AInternal clock generation circuit of semiconductor device and method for generating internal clockSAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted Nov 28, 2000·19 cites·21 claims
- 1558US6847559B2Input buffer circuit of a synchronous semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Jan 25, 2005·9 cites·7 claims
- 1657US7042800B2Method and memory system in which operating mode is set using address signalSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted May 9, 2006·9 cites·56 claims
- 1754US7480776B2Circuits and methods for providing variable data I/O width for semiconductor memory devicesSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Jan 20, 2009·8 cites·23 claims
- 1851US7657713B2Memory using packet controller and memorySAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Feb 2, 2010·7 cites·30 claims
- 1948US7168017B2Memory devices with selectively enabled output circuits for test mode and method of testing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Jan 23, 2007·6 cites·14 claims
- 2045US7336558B2Semiconductor memory device with reduced number of padsSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Feb 26, 2008·1 cites·10 claims
- 2145US7260013B2Power supply device in semiconductor memorySAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Aug 21, 2007·5 cites·33 claims
- 2245US2005168469A1Circuits and methods for transmission of addressing information to display memory circuits over data lines for sequential access to display dataFiled 2004·Application pending·0 cites
- 2344US6944089B2Synchronous semiconductor device having constant data output time regardless of bit organization, and method of adjusting data output timeSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Sep 13, 2005·4 cites·15 claims
- 2431US2004252689A1Memory system with reduced pin countFiled 2004·Application pending·0 cites
- 2527US5963501ADynamic clock signal generating circuit for use in synchronous dynamic random access memory devicesSAMSUNG ELECTRONICS COI LTD·Filed 1998·Granted Oct 5, 1999·3 cites·22 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →