Inventor · disambiguated record

Yu-Min Hung

Also filed as: HUNG YU-MIN

7 granted patents·2 pending applications·26 citations·filing 2009–2019

79Inventor score

Technology areasH10P F16C G02F G06F H01R

Files withMACRONIX INT CO LTD5 AU OPTRONICS CORP1 CHEN SHENG-WEN1 INTERFACE TECH CHENGDU CO LTD1 SUNG CHENG-KUO1

Top patents by PatentIndex Score

9 records

0181US7883259B2Backlight moduleAU OPTRONICS CORP·Filed 2009·Granted Feb 8, 2011·15 cites·19 claims
0272US9847339B2Self-aligned multiple patterning semiconductor device fabricationMACRONIX INT CO LTD·Filed 2016·Granted Dec 19, 2017·2 cites·6 claims
0371US8556509B2Active compensating hydrostatic bearing and hydrostatic bearing module using the sameSUNG CHENG-KUO·Filed 2012·Granted Oct 15, 2013·5 cites·17 claims
0461US10290543B1Method for manufacturing semiconductor deviceMACRONIX INT CO LTD·Filed 2017·Granted May 14, 2019·1 cites·16 claims
0551US11416090B2Touch device and manufacturing method thereofINTERFACE TECH CHENGDU CO LTD·Filed 2019·Granted Aug 16, 2022·0 cites·7 claims
0648US8882296B2Light emitting diode module and display device using the same light emitting diode moduleCHEN SHENG-WEN·Filed 2012·Granted Nov 11, 2014·3 cites·16 claims
0740US2016020216A1Semiconductor device and method of manufacturing thereof using a flowable material during the control gate removal for word line end formationMACRONIX INT CO LTD·Filed 2014·Application pending·0 cites
0834US9553047B2Method of manufacturing semiconductor devices with combined array and periphery patterning in self-aligned quadruple patterningMACRONIX INT CO LTD·Filed 2015·Granted Jan 24, 2017·0 cites·11 claims
0931US2016365311A1Method of manufacturing semiconductor devices with combined array and periphery patterning in self-aligned double patterningMACRONIX INT CO LTD·Filed 2015·Application pending·0 cites

Join the waitlist — get patent alerts

Get an alert when Yu-Min Hung files or is granted a new patent.

We store only your email — no account needed. See our privacy policy.

Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →