Inventor · disambiguated record
Ung Jang
Also filed as: JANG UNG · JANG UNG-JIN
8 granted patents·1 pending application·13 citations·filing 2007–2021
79Inventor score
Top patents by PatentIndex Score
9 records- 0171US10955513B2Test apparatus which tests semiconductor chipsSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Mar 23, 2021·1 cites·7 claims
- 0271US8872531B2Semiconductor device and test apparatus including the sameSONG KI-JAE·Filed 2011·Granted Oct 28, 2014·6 cites·17 claims
- 0368US8035661B2Driving apparatus of display device for gray range extension, display device including the same, and method of driving display device for gray range extensionSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Oct 11, 2011·2 cites·16 claims
- 0466US11506740B2Test apparatus which tests semiconductor chipsSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Nov 22, 2022·0 cites·20 claims
- 0566US9119546B2R-PEAK detection apparatus and control method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2012·Granted Sep 1, 2015·3 cites·18 claims
- 0657US9241671B2Apparatus and method for removing noise from biosignalsUNIV YONSEI IACF·Filed 2013·Granted Jan 26, 2016·1 cites·10 claims
- 0749US9612276B2Test device and test system including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Apr 4, 2017·0 cites·19 claims
- 0848US10203369B2Test board, test equipment, test system, and test methodSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Feb 12, 2019·0 cites·11 claims
- 0938US2014253099A1Semiconductor device on device interface board and test system using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2014·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →