Inventor · disambiguated record
Yung-Hsin Kuo
Also filed as: KUO YUNG L · KUO YUNG-HSIN
13 granted patents·1 pending application·55 citations·filing 2005–2017
89Inventor score
Files withKUO YUNG-HSIN8TAIWAN SEMICONDUCTOR MFG CO LTD3HUNG WENSEN1KUO YUNG L1TAIWAN SEMICONDUCTOR MFG1
Top patents by PatentIndex Score
14 records- 0188US9134368B2Contactless wafer probing with improved power supplyKUO YUNG-HSIN·Filed 2012·Granted Sep 15, 2015·15 cites·17 claims
- 0286US8723538B2Probe head formation methods employing guide plate raising assembly mechanismHUNG WENSEN·Filed 2011·Granted May 13, 2014·10 cites·16 claims
- 0385US8832933B2Method of fabricating a semiconductor test probe headKUO YUNG-HSIN·Filed 2011·Granted Sep 16, 2014·10 cites·19 claims
- 0477US8841931B2Probe card wiring structureKUO YUNG-HSIN·Filed 2011·Granted Sep 23, 2014·4 cites·11 claims
- 0575US10541185B2Semiconductor devices with bump allocationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Jan 21, 2020·2 cites·20 claims
- 0674US8643394B2Non-reflow probe card structureKUO YUNG-HSIN·Filed 2010·Granted Feb 4, 2014·3 cites·22 claims
- 0773US9557370B2Methods of improving bump allocation for semiconductor devices and semiconductor devices with improved bump allocationKUO YUNG-HSIN·Filed 2012·Granted Jan 31, 2017·3 cites·20 claims
- 0871US9417263B2Testing probe head for wafer level testing, and test probe cardTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Aug 16, 2016·3 cites·18 claims
- 0962US9207261B2High frequency probing structureTAIWAN SEMICONDUCTOR MFG·Filed 2014·Granted Dec 8, 2015·1 cites·20 claims
- 1061US9759745B2Probe cardTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Sep 12, 2017·2 cites·20 claims
- 1154US8134380B2Test probe structureKUO YUNG HSIN·Filed 2009·Granted Mar 13, 2012·2 cites·18 claims
- 1248US9261534B2Shield pin arrangementKUO YUNG-HSIN·Filed 2012·Granted Feb 16, 2016·0 cites·20 claims
- 1347US2007023446A1Device of storing cutleryKUO YUNG L·Filed 2005·Application pending·0 cites
- 1441US9891273B2Test structures and testing methods for semiconductor devicesKUO YUNG HSIN·Filed 2011·Granted Feb 13, 2018·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →