Inventor · disambiguated record
Orazio P. Forlenza
Also filed as: FORLENZA ORAZIO P · FORLENZA ORAZIO PASQUALE
19 granted patents·2 pending applications·236 citations·filing 1999–2020
94Inventor score
Top patents by PatentIndex Score
21 records- 0190US7908532B2Automated system and processing for expedient diagnosis of broken shift registers latch chainsIBM·Filed 2008·Granted Mar 15, 2011·22 cites·20 claims
- 0290US6308290B1Look ahead scan chain diagnostic methodIBM·Filed 1999·Granted Oct 23, 2001·80 cites·6 claims
- 0382US8086924B2Implementing diagnosis of transitional scan chain defects using logic built in self test LBIST test patternsFORLENZA DONATO ORAZIO·Filed 2008·Granted Dec 27, 2011·13 cites·20 claims
- 0482US7934134B2Method and apparatus for performing logic built-in self-testing of an integrated circuitIBM·Filed 2008·Granted Apr 26, 2011·11 cites·15 claims
- 0582US7225374B2ABIST-assisted detection of scan chain defectsIBM·Filed 2003·Granted May 29, 2007·29 cites·20 claims
- 0679US7234090B2Method and apparatus for selective scan chain diagnosticsIBM·Filed 2004·Granted Jun 19, 2007·25 cites·30 claims
- 0778US7930601B2AC ABIST diagnostic method, apparatus and program productIBM·Filed 2008·Granted Apr 19, 2011·11 cites·16 claims
- 0877US7392449B2Method, apparatus, and computer program product for diagnosing a scan chain failure employing fuses coupled to the scan chainIBM·Filed 2007·Granted Jun 24, 2008·7 cites·11 claims
- 0972US7921346B2Verification of array built-in self-test (ABIST) design-for-test/design-for-diagnostics (DFT/DFD)IBM·Filed 2008·Granted Apr 5, 2011·6 cites·1 claims
- 1070US7395470B2Method, apparatus, and computer program product for diagnosing a scan chain failure employing fuses coupled to the scan chainIBM·Filed 2005·Granted Jul 1, 2008·4 cites·9 claims
- 1168US7117415B2Automated BIST test pattern sequence generator software system and methodIBM·Filed 2004·Granted Oct 3, 2006·13 cites·18 claims
- 1267US7395469B2Method for implementing deterministic based broken scan chain diagnosticsIBM·Filed 2004·Granted Jul 1, 2008·12 cites·11 claims
- 1365US9244756B1Logic-built-in-self-test diagnostic method for root cause identificationIBM·Filed 2014·Granted Jan 26, 2016·1 cites·9 claims
- 1461US11378623B2Diagnostic enhancement for multiple instances of identical structuresIBM·Filed 2020·Granted Jul 5, 2022·0 cites·18 claims
- 1557US9244757B1Logic-built-in-self-test diagnostic method for root cause identificationIBM·Filed 2014·Granted Jan 26, 2016·0 cites·11 claims
- 1656US9274173B2Selective test pattern processorIBM·Filed 2014·Granted Mar 1, 2016·0 cites·11 claims
- 1756US7475308B2implementing deterministic based broken scan chain diagnosticsIBM·Filed 2008·Granted Jan 6, 2009·2 cites·7 claims
- 1854US9274172B2Selective test pattern processorIBM·Filed 2013·Granted Mar 1, 2016·0 cites·5 claims
- 1944US2007260926A1Static and dynamic learning test generation methodIBM·Filed 2006·Application pending·0 cites
- 2039US8065575B2Implementing isolation of VLSI scan chain using ABIST test patternsFORLENZA DONATO ORAZIO·Filed 2008·Granted Nov 22, 2011·0 cites·20 claims
- 2139US2009210761A1AC Scan Diagnostic Method and Apparatus Utilizing Functional Architecture Verification PatternsFORLENZA DONATO O·Filed 2008·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →