Inventor · disambiguated record
Kwan-Woo Ryu
Also filed as: RYU KWAN-WOO
6 granted patents·1 pending application·10 citations·filing 2003–2015
74Inventor score
Top patents by PatentIndex Score
7 records- 0172US9255789B2Method for measuring thickness of objectSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Feb 9, 2016·3 cites·20 claims
- 0252US6927077B2Method and apparatus for measuring contamination of a semiconductor substrateSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Aug 9, 2005·4 cites·21 claims
- 0350US2007222999A1Apparatus for monitoring a density profile of impuritiesSAMSUNG ELECTRONICS CO LTD·Filed 2007·Application pending·0 cites
- 0449US8551791B2Apparatus and method for manufacturing semiconductor devices through layer material dimension analysisPARK JANG-IK·Filed 2009·Granted Oct 8, 2013·1 cites·20 claims
- 0547US6869215B2Method and apparatus for detecting contaminants in ion-implanted waferSAMSUNG ELECTRIC·Filed 2003·Granted Mar 22, 2005·2 cites·15 claims
- 0645US9417055B2Apparatus for measuring thickness of thin film, system including the apparatus, and method for measuring thickness of thin filmSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Aug 16, 2016·0 cites·20 claims
- 0741US7186577B2Method for monitoring a density profile of impuritiesSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Mar 6, 2007·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →