Inventor · disambiguated record
Karson Knutson
Also filed as: KNUTSON KARSON · KNUTSON KARSON L
5 granted patents·5 pending applications·50 citations·filing 2004–2008
79Inventor score
Top patents by PatentIndex Score
10 records- 0176US7758238B2Temperature measurement with reduced extraneous infrared in a processing chamberINTEL CORP·Filed 2008·Granted Jul 20, 2010·8 cites·15 claims
- 0276US7102141B2Flash lamp annealing apparatus to generate electromagnetic radiation having selective wavelengthsINTEL CORP·Filed 2004·Granted Sep 5, 2006·19 cites·26 claims
- 0373US7109443B2Multi-zone reflecting device for use in flash lamp processesINTEL CORP·Filed 2004·Granted Sep 19, 2006·16 cites·26 claims
- 0472US7892971B2Sub-second annealing processes for semiconductor devicesINTEL CORP·Filed 2008·Granted Feb 22, 2011·5 cites·15 claims
- 0557US7767509B2Methods of forming a multilayer capping film to minimize differential heating in anneal processesINTEL CORP·Filed 2007·Granted Aug 3, 2010·2 cites·7 claims
- 0643US2009071918A1Vertical semiconductor wafer carrierRAMANARAYANAN PANCHAPAKESAN·Filed 2007·Application pending·0 cites
- 0742US2008242117A1Apparatus to reduce wafer edge temperature and breakage of wafersRAMANARAYANAN PANCHAPAKESAN·Filed 2007·Application pending·0 cites
- 0840US2008076226A1Apparatus and method of backside anneal for reduced topside pattern effectKNUTSON KARSON L·Filed 2006·Application pending·0 cites
- 0935US2006286807A1Use of active temperature control to provide emmisivity independent wafer temperatureHWANG JACK·Filed 2005·Application pending·0 cites
- 1032US2006004493A1Use of active temperature control to provide emmisivity independent wafer temperatureHWANG JACK·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →