Inventor · disambiguated record
Eiichi Umemura
Also filed as: UMEMURA EIICHI
8 granted patents·52 citations·filing 1999–2005
85Inventor score
Files withOKI ELECTRIC IND CO LTD8
Top patents by PatentIndex Score
8 records- 0185US7081758B2Inspection pattern, inspection method, and inspection system for detection of latent defect of multi-layer wiring structureOKI ELECTRIC IND CO LTD·Filed 2005·Granted Jul 25, 2006·13 cites·20 claims
- 0267US6884637B2Inspection pattern, inspection method, and inspection system for detection of latent defect of multi-layer wiring structureOKI ELECTRIC IND CO LTD·Filed 2002·Granted Apr 26, 2005·12 cites·16 claims
- 0358US6677236B2Semiconductor device fabrication method for interconnects that suppresses loss of interconnect metalOKI ELECTRIC IND CO LTD·Filed 2001·Granted Jan 13, 2004·8 cites·4 claims
- 0456US6690092B2Multilayer interconnection structure of a semiconductor deviceOKI ELECTRIC IND CO LTD·Filed 2001·Granted Feb 10, 2004·5 cites·14 claims
- 0546US6346749B1Semiconductor deviceOKI ELECTRIC IND CO LTD·Filed 1999·Granted Feb 12, 2002·12 cites·19 claims
- 0637US6787705B2Interconnection structure of semiconductor elementOKI ELECTRIC IND CO LTD·Filed 2002·Granted Sep 7, 2004·0 cites·12 claims
- 0736US6444918B1Interconnection structure of semiconductor elementOKI ELECTRIC IND CO LTD·Filed 2001·Granted Sep 3, 2002·0 cites·6 claims
- 0830US7215029B1Multilayer interconnection structure of a semiconductorOKI ELECTRIC IND CO LTD·Filed 1999·Granted May 8, 2007·2 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →