Inventor · disambiguated record
Roshni Biswas
Also filed as: BISWAS ROSHNI
5 granted patents·3 citations·filing 2017–2022
68Inventor score
Technology areasG03F
Files withASML NETHERLANDS BV5
Top patents by PatentIndex Score
5 records- 0194US11972194B2Method for determining patterning device pattern based on manufacturabilityASML NETHERLANDS BV·Filed 2022·Granted Apr 30, 2024·2 cites·20 claims
- 0280US11789371B2Methods of determining scattering of radiation by structures of finite thicknesses on a patterning deviceASML NETHERLANDS BV·Filed 2022·Granted Oct 17, 2023·0 cites·20 claims
- 0378US11580289B2Method for determining patterning device pattern based on manufacturabilityASML NETHERLANDS BV·Filed 2019·Granted Feb 14, 2023·1 cites·22 claims
- 0474US11409203B2Methods of determining scattering of radiation by structures of finite thicknesses on a patterning deviceASML NETHERLANDS BV·Filed 2021·Granted Aug 9, 2022·0 cites·21 claims
- 0561US11016395B2Methods of determining scattering of radiation by structures of finite thicknesses on a patterning deviceASML NETHERLANDS BV·Filed 2017·Granted May 25, 2021·0 cites·22 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →