Inventor · disambiguated record
Dzmitry S. Maliuk
Also filed as: MALIUK DZMITRY · MALIUK DZMITRY S
5 granted patents·3 citations·filing 2013–2017
70Inventor score
Technology areasG01R
Files withIBM5
Top patents by PatentIndex Score
5 records- 0185US9261561B2Scan chain latch design that improves testability of integrated circuitsIBM·Filed 2015·Granted Feb 16, 2016·2 cites·20 claims
- 0269US9086457B2Scan chain latch design that improves testability of integrated circuitsIBM·Filed 2013·Granted Jul 21, 2015·1 cites·20 claims
- 0362US10571520B2Scan chain latch design that improves testability of integrated circuitsIBM·Filed 2017·Granted Feb 25, 2020·0 cites·20 claims
- 0460US9678152B2Scan chain latch design that improves testability of integrated circuitsIBM·Filed 2016·Granted Jun 13, 2017·0 cites·20 claims
- 0559US9372231B2Scan chain latch design that improves testability of integrated circuitsIBM·Filed 2015·Granted Jun 21, 2016·0 cites·20 claims
Join the waitlist — get patent alerts
Get an alert when Dzmitry S. Maliuk files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →