Inventor · disambiguated record
Brian J. Arkin
Also filed as: ARKIN BRIAN · ARKIN BRIAN J
15 granted patents·1 pending application·512 citations·filing 1993–2009
94Inventor score
Top patents by PatentIndex Score
16 records- 0195US6028439AModular integrated circuit tester with distributed synchronization and controlCREDENCE SYSTEMS CORP·Filed 1997·Granted Feb 22, 2000·161 cites·13 claims
- 0292US5963074AProgrammable delay circuit having calibratable delaysCREDENCE SYSTEMS CORP·Filed 1997·Granted Oct 5, 1999·92 cites·12 claims
- 0390US7243278B2Integrated circuit tester with software-scaleable channelsCREDENCE SYSTEMS CORP·Filed 2005·Granted Jul 10, 2007·22 cites·15 claims
- 0482US5951705AIntegrated circuit tester having pattern generator controlled data busCREDENCE SYSTEMS CORP·Filed 1997·Granted Sep 14, 1999·55 cites·20 claims
- 0580US6073263AParallel processing pattern generation system for an integrated circuit testerCREDENCE SYSTEMS CORP·Filed 1997·Granted Jun 6, 2000·47 cites·20 claims
- 0676US6380730B1Integrated circuit tester having a program status memoryCREDENCE SYSTEMS CORP·Filed 2000·Granted Apr 30, 2002·22 cites·17 claims
- 0770US6256757B1Apparatus for testing memories with redundant storage elementsCREDENCE SYSTEMS CORP·Filed 2000·Granted Jul 3, 2001·19 cites·10 claims
- 0865US7893701B2Method and apparatus for enhanced probe card architectureFORMFACTOR INC·Filed 2009·Granted Feb 22, 2011·4 cites·29 claims
- 0964US8400176B2Wafer level contactorARKIN BRIAN J·Filed 2009·Granted Mar 19, 2013·6 cites·20 claims
- 1062US6060898AFormat sensitive timing calibration for an integrated circuit testerCREDENCE SYSTEMS CORP·Filed 1997·Granted May 9, 2000·24 cites·15 claims
- 1159US5280486AHigh speed fail processorTERADYNE INC·Filed 1993·Granted Jan 18, 1994·20 cites·4 claims
- 1252US5919270AProgrammable formatter circuit for integrated circuit testerCREDENCE SYSTEMS CORP·Filed 1997·Granted Jul 6, 1999·17 cites·17 claims
- 1346US5917834AIntegrated circuit tester having multiple period generatorsCREDENCE SYSTEMS CORP·Filed 1997·Granted Jun 29, 1999·13 cites·15 claims
- 1445US5923197APulse stuffing circuit for programmable delay lineCREDENCE SYSTEMS CORP·Filed 1997·Granted Jul 13, 1999·8 cites·9 claims
- 1540US6836868B1High-speed algorithmic pattern generatorCREDENCE SYSTEMS CORP·Filed 2000·Granted Dec 28, 2004·2 cites·18 claims
- 1631US2006267570A1Apparatus and method for testing bio-semiconductor integrated circuitsARKIN BRIAN J·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →