Inventor · disambiguated record
Ankan Pramanick
Also filed as: PRAMANICK ANKAN
15 granted patents·3 pending applications·276 citations·filing 2003–2013
93Inventor score
Top patents by PatentIndex Score
18 records- 0192US7184917B2Method and system for controlling interchangeable components in a modular test systemADVANTEST AMERICA R & D CT INC·Filed 2004·Granted Feb 27, 2007·63 cites·26 claims
- 0291US7209851B2Method and structure to develop a test program for semiconductor integrated circuitsADVANTEST AMERICA R & D CT INC·Filed 2004·Granted Apr 24, 2007·60 cites·30 claims
- 0388US7197417B2Method and structure to develop a test program for semiconductor integrated circuitsADVANTEST AMERICA R & D CT INC·Filed 2004·Granted Mar 27, 2007·44 cites·30 claims
- 0487US8255198B2Method and structure to develop a test program for semiconductor integrated circuitsKRISHNASWAMY RAMACHANDRAN·Filed 2010·Granted Aug 28, 2012·11 cites·12 claims
- 0583US7210087B2Method and system for simulating a modular test systemADVANTEST AMERICA R & D CT INC·Filed 2004·Granted Apr 24, 2007·32 cites·34 claims
- 0682US8082541B2Method and system for performing installation and configuration management of tester instrument modulesPRAMANICK ANKAN·Filed 2005·Granted Dec 20, 2011·20 cites·22 claims
- 0781US7437261B2Method and apparatus for testing integrated circuitsADVANTEST CORP·Filed 2004·Granted Oct 14, 2008·17 cites·24 claims
- 0875US9785542B2Implementing edit and update functionality within a development environment used to compile test plans for automated semiconductor device testingADVANTEST CORP·Filed 2013·Granted Oct 10, 2017·5 cites·21 claims
- 0970US7543200B2Method and system for scheduling tests in a parallel test systemADVANTEST CORP·Filed 2005·Granted Jun 2, 2009·6 cites·20 claims
- 1059US7197416B2Supporting calibration and diagnostics in an open architecture test systemADVANTEST AMERICA R & D CT INC·Filed 2004·Granted Mar 27, 2007·8 cites·26 claims
- 1158US7430486B2Datalog support in a modular test systemADVANTEST AMERICA R & D CT INC·Filed 2004·Granted Sep 30, 2008·8 cites·14 claims
- 1245US9274911B2Using shared pins in a concurrent test execution environmentADVANTEST CORP·Filed 2013·Granted Mar 1, 2016·0 cites·23 claims
- 1342US9785526B2Automated generation of a test class pre-header from an interactive graphical user interfaceADVANTEST CORP·Filed 2013·Granted Oct 10, 2017·0 cites·19 claims
- 1441US2008016396A1Test emulator, test module emulator and record medium storing program thereinADVANTEST CORP·Filed 2007·Application pending·0 cites
- 1541US2008010524A1Test emulator, test module emulator and record medium storing program thereinADVANTEST CORP·Filed 2007·Application pending·0 cites
- 1638US7194668B2Event based test method for debugging timing related failures in integrated circuitsADVANTEST CORP·Filed 2003·Granted Mar 20, 2007·2 cites·20 claims
- 1735US8214800B2Compact representation of vendor hardware module revisions in an open architecture test systemPRAMANICK ANKAN·Filed 2005·Granted Jul 3, 2012·0 cites·21 claims
- 1833US2005039079A1Test emulator, test module emulator, and record medium storing program thereinFiled 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →