Inventor · disambiguated record
Won-Don Joo
Also filed as: JOO WON DON
9 granted patents·5 pending applications·11 citations·filing 2012–2023
79Inventor score
Files withSAMSUNG ELECTRONICS CO LTD14
Top patents by PatentIndex Score
14 records- 0183US10670968B2Maskless exposure method, maskless exposure apparatus and method of manufacturing a semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Jun 2, 2020·2 cites·20 claims
- 0281US8841824B2Broadband light illuminatorsSAMSUNG ELECTRONICS CO LTD·Filed 2012·Granted Sep 23, 2014·5 cites·20 claims
- 0375US10816480B2Method of detecting a defect on a substrate, apparatus for performing the same and method of manufacturing semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Oct 27, 2020·1 cites·19 claims
- 0469US9425036B2Light source device and semiconductor manufacturing apparatus including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Aug 23, 2016·2 cites·19 claims
- 0567US9839110B2Plasma light source apparatus and light source system including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Dec 5, 2017·1 cites·20 claims
- 0661US11047901B2Method of testing an interconnection substrate and apparatus for performing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Jun 29, 2021·0 cites·20 claims
- 0758US2024234177A1Wafer processing apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 0852US9255694B2Reflector structure of illumination optic systemSAMSUNG ELECTRONICS CO LTD·Filed 2013·Granted Feb 9, 2016·0 cites·14 claims
- 0951US2023102791A1Apparatus for substrate dicing and method therofSAMSUNG ELECTRONICS CO LTD·Filed 2022·Application pending·0 cites
- 1044US2013214180A1System and method for providing lightSAMSUNG ELECTRONICS CO LTD·Filed 2013·Application pending·0 cites
- 1142US10910202B2Plasma sensing device, plasma monitoring system and method of controlling plasma processesSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Feb 2, 2021·0 cites·19 claims
- 1237US2018073979A1Defect inspection system, method of inspecting defects, and method of fabricating semiconductor device using the methodSAMSUNG ELECTRONICS CO LTD·Filed 2017·Application pending·0 cites
- 1336US2020096778A1Optical rearrangement device, system including the same amd method of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2019·Application pending·0 cites
- 1433US9891537B2Maskless lithographic apparatus measuring accumulated amount of lightSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Feb 13, 2018·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →