Inventor · disambiguated record
Chun-Seok Jeong
Also filed as: JEONG CHUN-SEOK
65 granted patents·7 pending applications·398 citations·filing 2004–2024
98Inventor score
Top patents by PatentIndex Score
72 records- 0197US7570107B2Band-gap reference voltage generatorHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Aug 4, 2009·42 cites·12 claims
- 0296US7826583B2Clock data recovery apparatusHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Nov 2, 2010·40 cites·11 claims
- 0392US7643889B2Circuit and method of outputting temperature data of semiconductor memory apparatusHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Jan 5, 2010·29 cites·43 claims
- 0492US7451053B2On die thermal sensor of semiconductor memory device and method thereofHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Nov 11, 2008·25 cites·33 claims
- 0591US9620194B1Stacked memory device having serial to parallel address conversion, refresh control unit, and pipe control unitSK HYNIX INC·Filed 2016·Granted Apr 11, 2017·12 cites·20 claims
- 0688US7965571B2On die thermal sensorHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Jun 21, 2011·19 cites·25 claims
- 0785US8140293B2On die thermal sensorJEONG CHUN-SEOK·Filed 2007·Granted Mar 20, 2012·16 cites·52 claims
- 0885US7755383B2Calibration circuit, semiconductor memory device including the same, and operating method of the calibration circuitHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Jul 13, 2010·13 cites·10 claims
- 0985US7642808B2Impedance adjusting circuit and semiconductor memory device having the sameHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Jan 5, 2010·11 cites·13 claims
- 1083US8513996B2Semiconductor memory apparatus and method for correcting duty thereofKIM YONG HOON·Filed 2011·Granted Aug 20, 2013·6 cites·23 claims
- 1182US11037608B2Stacked memory device and memory system including the sameSK HYNIX INC·Filed 2019·Granted Jun 15, 2021·3 cites·21 claims
- 1282US9028141B2On die thermal sensor of semiconductor memory deviceJEONG CHUN-SEOK·Filed 2011·Granted May 12, 2015·4 cites·20 claims
- 1381US7710143B2Impedance matching circuit and semiconductor memory device with the sameHYNIX SEMICONDUCTOR INC·Filed 2007·Granted May 4, 2010·12 cites·23 claims
- 1480US9208898B2Semiconductor device and operating method of semiconductor deviceSK HYNIX INC·Filed 2013·Granted Dec 8, 2015·4 cites·18 claims
- 1580US7936616B2Die thermal sensor suitable for auto self refresh, integrated circuit with the same and method for on die thermal sensor suitable for auto self refreshHYNIX SEMICONDUCTOR INC·Filed 2008·Granted May 3, 2011·10 cites·14 claims
- 1680US7609195B2On die thermal sensor and method for generating thermal code of ODTSHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Oct 27, 2009·9 cites·22 claims
- 1778US8042999B2On die thermal sensor of semiconductor memory deviceHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Oct 25, 2011·9 cites·20 claims
- 1878US7573289B2Impedance matching circuit and semiconductor memory device with the sameHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Aug 11, 2009·10 cites·16 claims
- 1977US8519734B2Semiconductor apparatus, method for assigning chip IDs therein, and method for setting chip IDs thereofJEONG CHUN SEOK·Filed 2011·Granted Aug 27, 2013·4 cites·49 claims
- 2075US9830956B2Latch circuit and semiconductor apparatus including the sameSK HYNIX INC·Filed 2016·Granted Nov 28, 2017·2 cites·16 claims
- 2175US7876134B2Circuit for changing frequency of a signal and frequency change method thereofHYNIX SEMICONDUCTOR INC·Filed 2009·Granted Jan 25, 2011·7 cites·29 claims
- 2274US8854088B2Multi-chip system and semiconductor packageSK HYNIX INC·Filed 2013·Granted Oct 7, 2014·3 cites·15 claims
- 2374US7212055B2Open-loop digital duty cycle correction circuit without DLLHYNIX SEMICONDUCTOR INC·Filed 2004·Granted May 1, 2007·16 cites·12 claims
- 2473US7884637B2Calibration circuit and semiconductor memory device with the sameHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Feb 8, 2011·8 cites·16 claims
- 2572US9680460B2Signal transmission method of semiconductor integrated circuit for transmitting signal to a plurality of stacked semiconductor chipsSK HYNIX INC·Filed 2014·Granted Jun 13, 2017·2 cites·6 claims
- 2672US7632028B2Substrate transfer apparatusDMS CO LTD·Filed 2008·Granted Dec 15, 2009·4 cites·15 claims
- 2771US9275984B2Multi-chip package systemSK HYNIX INC·Filed 2013·Granted Mar 1, 2016·2 cites·4 claims
- 2871US8233333B2On die thermal sensor suitable for auto self refresh, integrated circuit with the same and method for on die thermal sensor suitable for auto self refreshJEONG CHUN-SEOK·Filed 2011·Granted Jul 31, 2012·2 cites·11 claims
- 2971US7953569B2On die thermal sensor of semiconductor memory device and method thereofHYNIX SEMICONDUCTOR INC·Filed 2008·Granted May 31, 2011·6 cites·36 claims
- 3071US7786753B2Output driver circuit, semiconductor memory device including the output driver circuit, and method for operating the semiconductor memory deviceHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Aug 31, 2010·7 cites·11 claims
- 3171US7508332B2On die thermal sensor having analog-to-digital converter for use in semiconductor memory deviceHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Mar 24, 2009·7 cites·26 claims
- 3270US8520725B2Data equalizing circuit and data equalizing methodJEONG CHUN SEOK·Filed 2012·Granted Aug 27, 2013·3 cites·17 claims
- 3369US8923081B2Semiconductor memory system and operating method thereofSK HYNIX INC·Filed 2013·Granted Dec 30, 2014·2 cites·18 claims
- 3467US9379715B2Semiconductor apparatus and system including plurality of channelsSK HYNIX INC·Filed 2014·Granted Jun 28, 2016·2 cites·18 claims
- 3567US7876636B2Semiconductor memory device and method for driving the sameHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Jan 25, 2011·5 cites·5 claims
- 3666US11423959B2Processing-in-memory devices for element-wise multiplicationSK HYNIX INC·Filed 2021·Granted Aug 23, 2022·0 cites·15 claims
- 3765US8283609B2On die thermal sensor in semiconductor memory deviceJEONG CHUN-SEOK·Filed 2007·Granted Oct 9, 2012·5 cites·21 claims
- 3864US9041423B2Semiconductor apparatus and testing method thereofJEONG CHUN SEOK·Filed 2011·Granted May 26, 2015·1 cites·18 claims
- 3964US7692418B2Band gap reference circuit and temperature information output apparatus using the sameHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Apr 6, 2010·5 cites·7 claims
- 4063US9552894B2Impedance calibration circuit, and semiconductor memory and memory system using the sameSK HYNIX INC·Filed 2014·Granted Jan 24, 2017·2 cites·20 claims
- 4163US8860231B2Semiconductor integrated circuit having multilayer structureJEONG CHUN-SEOK·Filed 2011·Granted Oct 14, 2014·1 cites·16 claims
- 4262US9336839B2Integrated circuit and memory deviceSK HYNIX INC·Filed 2014·Granted May 10, 2016·2 cites·14 claims
- 4362US2025029640A1Memory device related to signal transmissionSK HYNIX INC·Filed 2024·Application pending·0 cites
- 4461US11823764B2Processing-in-memory devices for element-wise multiplicationSK HYNIX INC·Filed 2022·Granted Nov 21, 2023·0 cites·14 claims
- 4561US8072822B2Data alignment circuit and method of semiconductor memory apparatusJEONG CHUN SEOK·Filed 2009·Granted Dec 6, 2011·4 cites·20 claims
- 4661US7936636B2Semiconductor memory device and method for reducing current consumption by controlling toggling of clockHYNIX SEMICONDUCTOR INC·Filed 2008·Granted May 3, 2011·4 cites·17 claims
- 4760US7610165B2Semiconductor memory device having on die thermal sensorHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Oct 27, 2009·4 cites·16 claims
- 4859US9337849B2Phase detector, phase-frequency detector, and digital phase locked loopSK HYNIX INC·Filed 2014·Granted May 10, 2016·1 cites·16 claims
- 4959US8941411B2Signal transmission circuitSK HYNIX INC·Filed 2013·Granted Jan 27, 2015·1 cites·17 claims
- 5059US7880661B2Analog-digital converter and on-die thermal sensor including the sameHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Feb 1, 2011·5 cites·25 claims
Showing the top 50 of 72 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →