Inventor · disambiguated record
Nobuyoshi Hattori
Also filed as: HATTORI NOBUYOSHI
22 granted patents·3 pending applications·462 citations·filing 1988–2023
96Inventor score
Files withMITSUBISHI ELECTRIC CORP13RENESAS TECH CORP4FUJIFILM BUSINESS INNOVATION CORP3ARIE HIROYUKI2AIZAWA TATSUYA1
Top patents by PatentIndex Score
25 records- 0192US6372593B1Method of manufacturing SOI substrate and semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Apr 16, 2002·66 cites·9 claims
- 0286US6473665B2Defect analysis method and process control methodMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Oct 29, 2002·37 cites·9 claims
- 0384US6465316B2SOI substrate and semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Oct 15, 2002·32 cites·10 claims
- 0480US5517027AMethod for detecting and examining slightly irregular surface states, scanning probe microscope therefor, and method for fabricating a semiconductor device or a liquid crystal display device using theseMITSUBISHI ELECTRIC CORP·Filed 1994·Granted May 14, 1996·55 cites·37 claims
- 0577US8814156B2Sheet processing apparatus and image forming systemFUJI XEROX CO LTD·Filed 2012·Granted Aug 26, 2014·4 cites·5 claims
- 0675US6016562AInspection data analyzing apparatus for in-line inspection with enhanced display of inspection resultsMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Jan 18, 2000·49 cites·17 claims
- 0772US4893320AApparatus for counting particles attached to surfaces of a solidMITSUBISHI ELECTRIC CORP·Filed 1988·Granted Jan 9, 1990·31 cites·19 claims
- 0871US7674668B2Method of manufacturing a semiconductor deviceRENESAS TECH CORP·Filed 2007·Granted Mar 9, 2010·3 cites·8 claims
- 0971US6341241B1Defect analysis method and process control methodMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Jan 22, 2002·36 cites·20 claims
- 1071US6202037B1Quality management system and recording mediumMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Mar 13, 2001·49 cites·8 claims
- 1170US6844242B2Method of manufacturing SOI waferRENESAS TECH CORP·Filed 2002·Granted Jan 18, 2005·18 cites·11 claims
- 1268US6741940B2Computer-implemented method of defect analysisRENESAS TECH CORP·Filed 2002·Granted May 25, 2004·13 cites·12 claims
- 1368US6252294B1Semiconductor device and semiconductor storage deviceMITSUBISHI ELECTRIC CORP·Filed 1999·Granted Jun 26, 2001·34 cites·20 claims
- 1463US6646306B2Semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Nov 11, 2003·8 cites·10 claims
- 1561US11782380B1Document reading device and image forming apparatusFUJIFILM BUSINESS INNOVATION CORP·Filed 2022·Granted Oct 10, 2023·0 cites·20 claims
- 1654US6914307B2Semiconductor device and method of manufacturing the sameMITSUBISHI ELECTRIC CORP·Filed 2003·Granted Jul 5, 2005·4 cites·8 claims
- 1752US11800029B1Transport device, document reading device, and image forming apparatusFUJIFILM BUSINESS INNOVATION CORP·Filed 2022·Granted Oct 24, 2023·0 cites·20 claims
- 1850US8242605B2Semiconductor device and method of manufacturing the sameARIE HIROYUKI·Filed 2010·Granted Aug 14, 2012·1 cites·10 claims
- 1948US2024019802A1Image forming apparatusFUJIFILM BUSINESS INNOVATION CORP·Filed 2023·Application pending·0 cites
- 2047US2005212056A1Semiconductor device and method of manufacturing the sameMITSUBISHI ELECTRIC CORP·Filed 2005·Application pending·0 cites
- 2144US5048331AContinuous rainwater monitoring systemMITSUBISHI ELECTRIC CORP·Filed 1990·Granted Sep 17, 1991·11 cites·8 claims
- 2240US5129198ACleaning device for semiconductor wafersTAIYO SANSO CO LTD·Filed 1991·Granted Jul 14, 1992·11 cites·11 claims
- 2337US10868921B2Information processing device, imaging device, and systemAIZAWA TATSUYA·Filed 2017·Granted Dec 15, 2020·0 cites·8 claims
- 2437US6769111B2Computer-implemented method of process analysisRENESAS TECH CORP·Filed 2002·Granted Jul 27, 2004·0 cites·12 claims
- 2535US2012302061A1Semiconductor device and method of manufacturing the sameARIE HIROYUKI·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →