Inventor · disambiguated record
Michael Ricchetti
Also filed as: RICCHETTI MICHAEL
9 granted patents·424 citations·filing 2000–2014
89Inventor score
Top patents by PatentIndex Score
9 records- 0197US6988232B2Method and apparatus for optimized parallel testing and access of electronic circuitsINTELLITECH CORP·Filed 2002·Granted Jan 17, 2006·182 cites·75 claims
- 0297US6594802B1Method and apparatus for providing optimized access to circuits for debug, programming, and testINTELLITECH CORP·Filed 2000·Granted Jul 15, 2003·143 cites·40 claims
- 0394US7574637B2Method and apparatus for optimized parallel testing and access of electronic circuitsINTELLITECH CORP·Filed 2005·Granted Aug 11, 2009·29 cites·34 claims
- 0491US6957371B2Method and apparatus for embedded built-in self-test (BIST) of electronic circuits and systemsINTELLITECH CORP·Filed 2002·Granted Oct 18, 2005·49 cites·83 claims
- 0588US7467342B2Method and apparatus for embedded built-in self-test (BIST) of electronic circuits and systemsINTELLITECH CORP·Filed 2005·Granted Dec 16, 2008·15 cites·85 claims
- 0659US9344075B2Measuring delay between signal edges of different signals using an undersampling clockADVANCED MICRO DEVICES INC·Filed 2014·Granted May 17, 2016·2 cites·20 claims
- 0751US9152749B2Management system, method and apparatus for licensed delivery and accounting of electronic circuitsRICCHETTI MICHAEL·Filed 2003·Granted Oct 6, 2015·0 cites·13 claims
- 0847US7406638B2System and method for optimized test and configuration throughput of electronic circuitsINTELLITECH CORP·Filed 2004·Granted Jul 29, 2008·4 cites·8 claims
- 0935US8443331B2Synchronizing TAP controller after power is restoredMETSIS SOPHOCLES R·Filed 2010·Granted May 14, 2013·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →