Inventor · disambiguated record
John V. Jensen
Also filed as: JENSEN JOHN · JENSEN JOHN V
15 granted patents·1,388 citations·filing 1996–2013
95Inventor score
Top patents by PatentIndex Score
15 records- 0199US6269472B1Optical proximity correction method and apparatusLSI LOGIC CORP·Filed 1997·Granted Jul 31, 2001·356 cites·22 claims
- 0299US5705301APerforming optical proximity correction with the aid of design rule checkersLSI LOGIC CORP·Filed 1996·Granted Jan 6, 1998·491 cites·18 claims
- 0398US6282696B1Performing optical proximity correction with the aid of design rule checkersLSI LOGIC CORP·Filed 1999·Granted Aug 28, 2001·278 cites·17 claims
- 0492US5900338APerforming optical proximity correction with the aid of design rule checkersLSI LOGIC CORP·Filed 1997·Granted May 4, 1999·86 cites·13 claims
- 0591US6499003B2Method and apparatus for application of proximity correction with unitary segmentationLSI LOGIC CORP·Filed 1998·Granted Dec 24, 2002·88 cites·13 claims
- 0679US6532585B1Method and apparatus for application of proximity correction with relative segmentationLSI LOGIC CORP·Filed 2000·Granted Mar 11, 2003·15 cites·35 claims
- 0776US7057261B2Mixed LVR and HVR reticle set design for the processing of gate arrays, embedded arrays and rapid chip productsLSI LOGIC CORP·Filed 2005·Granted Jun 6, 2006·4 cites·8 claims
- 0870US6175953B1Method and apparatus for general systematic application of proximity correctionLSI LOGIC CORP·Filed 1998·Granted Jan 16, 2001·29 cites·30 claims
- 0965US9072366B2Utility bucket backpack apparatusJENSEN JOHN V·Filed 2013·Granted Jul 7, 2015·5 cites·3 claims
- 1063US7325222B2Method and apparatus for verifying the post-optical proximity corrected mask wafer image sensitivity to reticle manufacturing errorsLSI LOGIC CORP·Filed 2004·Granted Jan 29, 2008·7 cites·18 claims
- 1161US7005217B2Chromeless phase shift maskLSI LOGIC CORP·Filed 2003·Granted Feb 28, 2006·6 cites·20 claims
- 1254US6174630B1Method of proximity correction with relative segmentationLSI LOGIC CORP·Filed 1998·Granted Jan 16, 2001·12 cites·18 claims
- 1352US5703376AMulti-level resolution lithographyLSI LOGIC CORP·Filed 1996·Granted Dec 30, 1997·10 cites·16 claims
- 1448US7127698B2Method for reducing reticle set costLSI LOGIC CORP·Filed 2003·Granted Oct 24, 2006·1 cites·20 claims
- 1541US6900075B2Mixed LVR and HVR reticle set design for the processing of gate arrays, embedded arrays and rapid chip productsLSI LOGIC CORP·Filed 2003·Granted May 31, 2005·0 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →