Inventor · disambiguated record
Mincent Lee
Also filed as: LEE MINCENT
6 granted patents·9 citations·filing 2008–2020
75Inventor score
Top patents by PatentIndex Score
6 records- 0186US10073135B2Alignment testing for tiered semiconductor structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Sep 11, 2018·2 cites·20 claims
- 0285US9658281B2Alignment testing for tiered semiconductor structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted May 23, 2017·4 cites·20 claims
- 0382US10641819B2Alignment testing for tiered semiconductor structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted May 5, 2020·1 cites·20 claims
- 0472US11231453B2Alignment testing for tiered semiconductor structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Jan 25, 2022·0 cites·20 claims
- 0544US9915699B2Integrated fan-out pillar probe systemTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Mar 13, 2018·0 cites·20 claims
- 0643US8095832B2Method for repairing memory and system thereofLEE MINCENT·Filed 2008·Granted Jan 10, 2012·2 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →