Inventor · disambiguated record
Pedro Barbosa Zanetta
Also filed as: ZANETTA PEDRO B · ZANETTA PEDRO BARBOSA
14 granted patents·35 citations·filing 2012–2017
89Inventor score
Top patents by PatentIndex Score
14 records- 0191US9964975B1Semiconductor devices for sensing voltagesNXP USA INC·Filed 2017·Granted May 8, 2018·8 cites·20 claims
- 0283US10061339B1Feedback circuit and methods for negative charge pumpNXP USA INC·Filed 2017·Granted Aug 28, 2018·4 cites·20 claims
- 0381US10205423B1Rail-to-rail source followerNXP USA INC·Filed 2017·Granted Feb 12, 2019·4 cites·20 claims
- 0480US8901991B2Power monitoring circuitryFREESCALE SEMICONDUCTOR INC·Filed 2013·Granted Dec 2, 2014·4 cites·17 claims
- 0577US10050526B2Switching power converterFREESCALE SEMICONDUCTOR INC·Filed 2016·Granted Aug 14, 2018·3 cites·20 claims
- 0674US9680453B1Oscillator circuitFREESCALE SEMICONDUCTOR INC·Filed 2016·Granted Jun 13, 2017·3 cites·19 claims
- 0774US9644593B2Cold-crank event managementFREESCALE SEMICONDUCTOR INC·Filed 2014·Granted May 9, 2017·3 cites·13 claims
- 0868US9310261B2Production-test die temperature measurement method and apparatusFREESCALE SEMICONDUCTOR INC·Filed 2015·Granted Apr 12, 2016·1 cites·12 claims
- 0964US9148056B2Voltage regulation system for integrated circuitZANETTA PEDRO BARBOSA·Filed 2014·Granted Sep 29, 2015·3 cites·20 claims
- 1056US9509305B2Power gating techniques with smooth transitionFREESCALE SEMICONDUCTOR INC·Filed 2014·Granted Nov 29, 2016·1 cites·20 claims
- 1155US9110484B2Temperature dependent biasing for leakage power reductionFREESCALE SEMICONDUCTOR INC·Filed 2013·Granted Aug 18, 2015·1 cites·13 claims
- 1251US9074943B2Production-test die temperature measurementFREESCALE SEMICONDUCTOR INC·Filed 2012·Granted Jul 7, 2015·0 cites·8 claims
- 1338US9741449B1Sample and hold circuitFREESCALE SEMICONDUCTOR INC·Filed 2016·Granted Aug 22, 2017·0 cites·18 claims
- 1436US9356569B2Ready-flag circuitry for differential amplifiersFREESCALE SEMICONDUCTOR INC·Filed 2013·Granted May 31, 2016·0 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →