Inventor · disambiguated record
Yuzi Kanazawa
Also filed as: KANAZAWA YUZI
16 granted patents·4 pending applications·171 citations·filing 1997–2022
90Inventor score
Top patents by PatentIndex Score
20 records- 0183US6327694B1Cell placement apparatus and method, and computer readable record medium having cell placement program recorded thereonFUJITSU LTD·Filed 1998·Granted Dec 4, 2001·123 cites·24 claims
- 0280US11302039B2Waveform analyzerSHIMADZU CORP·Filed 2017·Granted Apr 12, 2022·5 cites·15 claims
- 0375US11486866B2Waveform analyzerSHIMADZU CORP·Filed 2017·Granted Nov 1, 2022·1 cites·10 claims
- 0474US6691293B2Layout instrument for semiconductor integrated circuits, layout method for semiconductor integrated circuits and recording medium that stores a program for determining layout of semiconductor integrated circuitsFUJITSU LTD·Filed 2001·Granted Feb 10, 2004·22 cites·16 claims
- 0566US7966590B2Circuit design data conversion apparatus, circuit design data conversion method, and computer productFUJITSU LTD·Filed 2008·Granted Jun 21, 2011·4 cites·4 claims
- 0666US7631280B2Method and apparatus for determining LSI type, method and apparatus for supporting LSI design, and computer productFUJITSU LTD·Filed 2007·Granted Dec 8, 2009·2 cites·18 claims
- 0764US8407642B2Leak current calculation apparatus and method for calculating leak currentKANAZAWA YUZI·Filed 2010·Granted Mar 26, 2013·2 cites·17 claims
- 0862US2005004859A1Method and apparatus for lottery trade management, and program and recording medium thereofFUJITSU LTD·Filed 2004·Application pending·0 cites
- 0957US8024684B2Apparatus, method, and computer product for estimating power consumption of LSIFUJITSU LTD·Filed 2007·Granted Sep 20, 2011·1 cites·9 claims
- 1055US8181136B2Circuit operation verification method and apparatusKANAZAWA YUZI·Filed 2009·Granted May 15, 2012·1 cites·7 claims
- 1150US2023281331A1Control method and information processing apparatusFUJITSU LTD·Filed 2022·Application pending·0 cites
- 1248US12072323B2Analyzer configured to display list of target componentsSHIMADZU CORP·Filed 2019·Granted Aug 27, 2024·0 cites·14 claims
- 1347US8539324B2Processing unitISHIDA TSUTOMU·Filed 2012·Granted Sep 17, 2013·0 cites·9 claims
- 1447US8074192B2Verification support apparatus, verification support method, and computer productKANAZAWA YUZI·Filed 2009·Granted Dec 6, 2011·0 cites·11 claims
- 1543US9348958B2Method and apparatus for calculating yieldHIGUCHI HIROYUKI·Filed 2012·Granted May 24, 2016·0 cites·15 claims
- 1643US8726100B2Non-transitory computer-readable recording medium in which a failure analyzing program is recorded, failure analyzing apparatus, and method for analyzing failureKANAZAWA YUZI·Filed 2011·Granted May 13, 2014·0 cites·20 claims
- 1742US2020193329A1Learning method and learning apparatusFUJITSU LTD·Filed 2019·Application pending·0 cites
- 1841US8151367B2Information processing systemKANAZAWA YUZI·Filed 2005·Granted Apr 3, 2012·0 cites·6 claims
- 1939US2011088004A1Tool identifying method and apparatusFUJITSU LTD·Filed 2010·Application pending·0 cites
- 2037US6038382AMethod and apparatus for optimizing cell allocationFUJITSU LTD·Filed 1997·Granted Mar 14, 2000·10 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →