Inventor · disambiguated record
Ares J. Rosakis
Also filed as: ROSAKIS ARES · ROSAKIS ARES J
14 granted patents·3 pending applications·491 citations·filing 1998–2025
94Inventor score
Top patents by PatentIndex Score
17 records- 0192US6469788B2Coherent gradient sensing ellipsometerCALIFORNIA INST OF TECHN·Filed 2001·Granted Oct 22, 2002·60 cites·29 claims
- 0291US7538891B1Surface characterization based on lateral shearing of diffracted wave fronts to measure in-plane and out-of-plane displacement gradient fieldsCALIFORNIA INST OF TECHN·Filed 2006·Granted May 26, 2009·41 cites·37 claims
- 0391US6781702B2Determining large deformations and stresses of layered and graded structures to include effects of body forcesCALIFORNIA INST OF TECHN·Filed 2002·Granted Aug 24, 2004·57 cites·21 claims
- 0491US6600565B1Real-time evaluation of stress fields and properties in line features formed on substratesCALIFORNIA INST OF TECHN·Filed 2000·Granted Jul 29, 2003·49 cites·39 claims
- 0590US7990543B1Surface characterization based on optical phase shifting interferometryCALIFORNIA INST OF TECHN·Filed 2008·Granted Aug 2, 2011·35 cites·17 claims
- 0687US6031611ACoherent gradient sensing method and system for measuring surface curvatureCALIFORNIA INST OF TECHN·Filed 1998·Granted Feb 29, 2000·100 cites·18 claims
- 0780US7966135B2Characterizing curvatures and stresses in thin-film structures on substrates having spatially non-uniform variationsCALIFORNIA INST OF TECHN·Filed 2006·Granted Jun 21, 2011·13 cites·13 claims
- 0879US12196170B2System for generating electricity from an underwater ocean streamENERGY VAULT INC·Filed 2024·Granted Jan 14, 2025·0 cites·17 claims
- 0979US7930113B1Measuring stresses in multi-layer thin film systems with variable film thicknessCALIFORNIA INST OF TECHN·Filed 2008·Granted Apr 19, 2011·12 cites·21 claims
- 1078US6268883B1High speed infrared imaging system and methodCALIFORNIA INST OF TECHN·Filed 1998·Granted Jul 31, 2001·88 cites·16 claims
- 1177US6924497B2Systems for measuring stresses in line features formed on substratesCALIFORNIA INST OF TECHN·Filed 2003·Granted Aug 2, 2005·15 cites·9 claims
- 1273US7363173B2Techniques for analyzing non-uniform curvatures and stresses in thin-film structures on substrates with non-local effectsCALIFORNIA INST OF TECHN·Filed 2005·Granted Apr 22, 2008·9 cites·33 claims
- 1368US2025369413A1System for generating electricity from an underwater ocean streamENERGY VAULT INC·Filed 2025·Application pending·0 cites
- 1458US7487050B2Techniques and devices for characterizing spatially non-uniform curvatures and stresses in thin-film structures on substrates with non-local effectsCALIFORNIA INST OF TECHN·Filed 2006·Granted Feb 3, 2009·5 cites·13 claims
- 1551US7369251B2Full-field optical measurements of surface properties of panels, substrates and wafersULTRATECH INC·Filed 2004·Granted May 6, 2008·7 cites·38 claims
- 1637US2005030551A1Analysis and monitoring of stresses in embedded lines and vias integrated on substratesFiled 2004·Application pending·0 cites
- 1730US2005007601A1Optical characterization of surfaces and platesFiled 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →