Inventor · disambiguated record
Jae-Hyeong Lee
Also filed as: LEE JAE HYEONG
19 granted patents·3 pending applications·649 citations·filing 1994–2024
95Inventor score
Files withSAMSUNG ELECTRONICS CO LTD13SK SILTRON CO LTD4KIM HEUY DONG1LG SILTRON INC1REPUBLIC KOREA NAT FORENSIC SERVICE DIRECTOR MINISTRY OF PUBLIC ADMINISTRATION & SECURITY1
Top patents by PatentIndex Score
22 records- 0196US6498766B2Integrated circuit memory devices that utilize indication signals to increase reliability of reading and writing operations and methods of operating sameSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Dec 24, 2002·137 cites·35 claims
- 0295US6034916AData masking circuits and methods for integrated circuit memory devices, including data strobe signal synchronizationSAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted Mar 7, 2000·149 cites·34 claims
- 0394US6459651B1Semiconductor memory device having data masking pin and memory system including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Oct 1, 2002·89 cites·13 claims
- 0491US5467032AWord line driver circuit for a semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 1994·Granted Nov 14, 1995·92 cites·18 claims
- 0582US6285225B1Delay locked loop circuits and methods of operation thereofSAMSUNG ELECTRONICS CO LTD·Filed 1999·Granted Sep 4, 2001·52 cites·20 claims
- 0679US5590079AWafer burn-in test circuit of a semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 1995·Granted Dec 31, 1996·47 cites·20 claims
- 0771US10325823B2Wafer and wafer defect analysis methodSK SILTRON CO LTD·Filed 2016·Granted Jun 18, 2019·1 cites·16 claims
- 0871US6058495AMulti-bit test circuit in semiconductor memory device and method thereofSAMSUNG ELECTRONICS CO LTD·Filed 1997·Granted May 2, 2000·31 cites·15 claims
- 0964US9904994B2Method and apparatus for analyzing shape of waferLG SILTRON INC·Filed 2014·Granted Feb 27, 2018·1 cites·18 claims
- 1064US5715206ADynamic random access memory having sequential word line refreshSAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted Feb 3, 1998·24 cites·3 claims
- 1162US10541181B2Wafer and wafer defect analysis methodSK SILTRON CO LTD·Filed 2019·Granted Jan 21, 2020·0 cites·11 claims
- 1262US2025232200A1Superconducting quantum computer with air-bridge type superconducting couplerSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 1355US5687128APower supply voltage boosting circuit of semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 1995·Granted Nov 11, 1997·16 cites·26 claims
- 1453US12331704B2Production process for hydrogen-enriched slush LNG fuel and deviceKIM HEUY DONG·Filed 2024·Granted Jun 17, 2025·0 cites·6 claims
- 1551US11955386B2Method for evaluating defective region of waferSK SILTRON CO LTD·Filed 2018·Granted Apr 9, 2024·0 cites·10 claims
- 1650US10816567B2Method, apparatus, and computer program for estimating speed of vehicle passing over horizontally grooved road by using acoustic analysisREPUBLIC KOREA NAT FORENSIC SERVICE DIRECTOR MINISTRY OF PUBLIC ADMINISTRATION & SECURITY·Filed 2018·Granted Oct 27, 2020·0 cites·7 claims
- 1748US10634622B2Method of identifying defect regions in waferSK SILTRON CO LTD·Filed 2018·Granted Apr 28, 2020·0 cites·11 claims
- 1848US6901018B2Method of generating initializing signal in semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted May 31, 2005·5 cites·8 claims
- 1943US6965528B2Memory device having high bus efficiency of network, operating method of the same, and memory system including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Nov 15, 2005·3 cites·10 claims
- 2038US2019139333A1Method, apparatus and computer program for determining recording time of event data recorder using acoustic analysisREPUBLIC OF KOREA NTL FORENSIC SERVICE DIRECTOR MINI OF PUBLIC ADMINISTRATION AND SECURITY·Filed 2018·Application pending·0 cites
- 2137US7173871B2Semiconductor memory device and method of outputting data strobe signal thereofSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Feb 6, 2007·2 cites·7 claims
- 2235US2018246196A1Method and system for estimating vehicle velocityREPUBLIC OF KOREA NAT FORENSIC SERVICE DIRECTOR MINISTRY OF PUBLIC ADM AND SECURITY·Filed 2018·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →