Inventor · disambiguated record
Oswald Spindler
Also filed as: SPINDLER OSWALD
12 granted patents·364 citations·filing 1989–2003
92Inventor score
Top patents by PatentIndex Score
12 records- 0194US6177698B1Formation of controlled trench top isolation layers for vertical transistorsINFINEON TECHNOLOGIES CORP·Filed 1999·Granted Jan 23, 2001·144 cites·10 claims
- 0293US5281302AMethod for cleaning reaction chambers by plasma etchingSIEMENS AG·Filed 1993·Granted Jan 25, 1994·87 cites·7 claims
- 0370US6184091B1Formation of controlled trench top isolation layers for vertical transistorsINFINEON TECHNOLOGIES CORP·Filed 1999·Granted Feb 6, 2001·32 cites·19 claims
- 0466US5965203AMethod for depositing a silicon oxide layerSIEMENS AG·Filed 1996·Granted Oct 12, 1999·27 cites·8 claims
- 0560US6429092B1Collar formation by selective oxide depositionINFINEON TECHNOLOGIES AG·Filed 2000·Granted Aug 6, 2002·7 cites·15 claims
- 0659US5399389AMethod for locally and globally planarizing chemical vapor deposition of SiO2 layers onto structured silicon substratesSIEMENS AG·Filed 1993·Granted Mar 21, 1995·31 cites·15 claims
- 0754US5629053AMethod for manufacturing microcrystalline cubic boron-nitride-layersSIEMENS AG·Filed 1991·Granted May 13, 1997·17 cites·11 claims
- 0841US4990365AMethod for producing silicon boronitride layersSIEMENS AG·Filed 1989·Granted Feb 5, 1991·11 cites·12 claims
- 0940US6815224B2Low-temperature processing of a ferroelectric strontium bismuth tantalate layer, and fabrication of ferroelectric components using the layerINFINEON TECHNOLOGIES AG·Filed 2003·Granted Nov 9, 2004·0 cites·12 claims
- 1033US5837611AProduction method for an insulation layer functioning as an intermetal dielectricSIEMENS AG·Filed 1997·Granted Nov 17, 1998·4 cites·9 claims
- 1132US6380074B1Deposition of various base layers for selective layer growth in semiconductor productionINFINEON TECHNOLOGIES AG·Filed 2000·Granted Apr 30, 2002·0 cites·11 claims
- 1232US5780103AMethod for forming of a silicon oxide layer on a topographySIEMENS AG·Filed 1996·Granted Jul 14, 1998·4 cites·22 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →