Inventor · disambiguated record
Chia-Tai Chang
Also filed as: CHANG CHIA-TAI
11 granted patents·1 pending application·41 citations·filing 2006–2021
85Inventor score
Top patents by PatentIndex Score
12 records- 0187US12025637B2Probe cardMPI CORP·Filed 2021·Granted Jul 2, 2024·2 cites·18 claims
- 0286US7791359B2Probe for high frequency signal transmission and probe card using the sameMPI CORP·Filed 2008·Granted Sep 7, 2010·11 cites·16 claims
- 0385US7953984B1Enhanced malware detection utilizing transparently integrated searchingTREND MICRO INC·Filed 2006·Granted May 31, 2011·22 cites·16 claims
- 0471US9201098B2High frequency probe cardMPI CORP·Filed 2013·Granted Dec 1, 2015·3 cites·20 claims
- 0564US8884640B2Integrated high-speed probe systemWANG CHUN-CHI·Filed 2012·Granted Nov 11, 2014·2 cites·21 claims
- 0662US9354253B2Probe moduleMPI CORP·Filed 2013·Granted May 31, 2016·1 cites·20 claims
- 0751US9519010B2Integrated high-speed probe systemMPI CORP·Filed 2014·Granted Dec 13, 2016·0 cites·26 claims
- 0845US9535093B2High frequency probe card for probing photoelectric deviceMPI CORP·Filed 2014·Granted Jan 3, 2017·0 cites·17 claims
- 0944US8106673B2Probe for high frequency signal transmissionKU WEI-CHENG·Filed 2010·Granted Jan 31, 2012·0 cites·14 claims
- 1043US9244018B2Probe holding structure and optical inspection device equipped with the sameMPI CORP·Filed 2013·Granted Jan 26, 2016·0 cites·24 claims
- 1141US9903888B2Probe card and test equipment with the sameMPI CORP·Filed 2015·Granted Feb 27, 2018·0 cites·19 claims
- 1238US2014016124A1Optical inspection deviceMPI CORP·Filed 2013·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →