Inventor · disambiguated record
Justin Jia-Jen Hwu
Also filed as: HWU JUSTIN · HWU JUSTIN JIA-JEN
13 granted patents·4 pending applications·20 citations·filing 2003–2016
85Inventor score
Files withSEAGATE TECHNOLOGY LLC5HITACHI GLOBAL STORAGE TECH4FELDBAUM MICHAEL R2XU YUAN2GAUZNER GENNADY1
Top patents by PatentIndex Score
17 records- 0188US8308964B2Planarization method for mediaXU YUAN·Filed 2010·Granted Nov 13, 2012·12 cites·20 claims
- 0272US9330885B2Method of stack patterning using a ion etchingFELDBAUM MICHAEL R·Filed 2011·Granted May 3, 2016·3 cites·21 claims
- 0357US9809887B2Method of patterning a stackSEAGATE TECHNOLOGY LLC·Filed 2016·Granted Nov 7, 2017·0 cites·20 claims
- 0455US7454828B2Method for manufacturing a magnetic write headHITACHI GLOBAL STORAGE TECH·Filed 2005·Granted Nov 25, 2008·2 cites·25 claims
- 0555US2014308439A1Method of protecting patierned magnetic materials of a stackSEAGATE TECHNOLOGY LLC·Filed 2014·Application pending·0 cites
- 0654US7323350B2Method of fabricating thin film calibration features for electron/ion beam image based metrologyHITACHI GLOBAL STORAGE TECH·Filed 2004·Granted Jan 29, 2008·3 cites·12 claims
- 0752US8946835B2Magnetic device with different planarization areasXU YUAN·Filed 2012·Granted Feb 3, 2015·0 cites·19 claims
- 0851US9638995B2Method of sheared guiding patternsSEAGATE TECHNOLOGY LLC·Filed 2014·Granted May 2, 2017·0 cites·10 claims
- 0951US9284649B2Method of patterning a stackFELDBAUM MICHAEL R·Filed 2011·Granted Mar 15, 2016·0 cites·24 claims
- 1051US2013004736A1Method of protecting patterned magnetic materials of a stackSEAGATE TECHNOLOGY LLC·Filed 2011·Application pending·0 cites
- 1148US9171703B2Apparatus with sidewall protection for featuresSEAGATE TECHNOLOGY LLC·Filed 2013·Granted Oct 27, 2015·0 cites·25 claims
- 1242US8792201B2Method of disc alignment using printed alignment marksGAUZNER GENNADY·Filed 2009·Granted Jul 29, 2014·0 cites·20 claims
- 1340US9469525B2Modified surface for block copolymer self-assemblyYANG XIAOMIN·Filed 2011·Granted Oct 18, 2016·0 cites·17 claims
- 1440US7783101B2Method and system for determining dimensions of a structure having a re-entrant profileHITACHI GLOBAL STORAGE TECH·Filed 2004·Granted Aug 24, 2010·0 cites·32 claims
- 1539US2013337176A1Nano-scale void reductionHWU JUSTIN JIA-JEN·Filed 2012·Application pending·0 cites
- 1638US2012025426A1Method and system for thermal imprint lithographyKUO DAVID·Filed 2010·Application pending·0 cites
- 1737US6929961B2Dual function array feature for CMP process control and inspectionHITACHI GLOBAL STORAGE TECH·Filed 2003·Granted Aug 16, 2005·0 cites·22 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →