Inventor · disambiguated record
William Clay Schluchter
Also filed as: SCHLUCHTER WILLIAM C · SCHLUCHTER WILLIAM CLAY
9 granted patents·3 pending applications·140 citations·filing 2004–2021
85Inventor score
Top patents by PatentIndex Score
12 records- 0195US7561280B2Displacement measurement sensor head and system having measurement sub-beams comprising zeroth order and first order diffraction componentsAGILENT TECHNOLOGIES INC·Filed 2008·Granted Jul 14, 2009·116 cites·21 claims
- 0275US7545507B2Displacement measurement systemAGILENT TECHNOLOGIES INC·Filed 2007·Granted Jun 9, 2009·4 cites·27 claims
- 0371US7355719B2Interferometer for measuring perpendicular translationsAGILENT TECHNOLOGIES INC·Filed 2005·Granted Apr 8, 2008·8 cites·20 claims
- 0466US11236985B2Systems and methods for cyclic error correction in a heterodyne interferometerKEYSIGHT TECHNOLOGIES INC·Filed 2021·Granted Feb 1, 2022·0 cites·18 claims
- 0562US7130056B2System and method of using a side-mounted interferometer to acquire position informationAGILENT TECHNOLOGIES INC·Filed 2004·Granted Oct 31, 2006·7 cites·21 claims
- 0656US2019113329A1Systems and methods for cyclic error correction in a heterodyne interferometerKEYSIGHT TECHNOLOGIES INC·Filed 2018·Application pending·0 cites
- 0754US7362447B2Low walk-off interferometerAGILENT TECHNOLOGIES INC·Filed 2005·Granted Apr 22, 2008·2 cites·17 claims
- 0853US7251039B1Low non-linear error displacement measuring interferometerAGILENT TECHNOLOGIES INC·Filed 2005·Granted Jul 31, 2007·2 cites·18 claims
- 0949US7436519B2System and method for interferometer non-linearity compensationAGILENT TECHNOLOGIES INC·Filed 2005·Granted Oct 14, 2008·1 cites·29 claims
- 1044US7924433B2Displacement measurement system and method of useAGILENT TECHNOLOGIES INC·Filed 2008·Granted Apr 12, 2011·0 cites·19 claims
- 1139US2006245071A1Lens correction element, system and methodAGILENT TECHNOLOGIES INC·Filed 2005·Application pending·0 cites
- 1237US2005175217A1Using target images to determine a location of a stageFiled 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →