Inventor · disambiguated record
Mitsutaka Niiro
Also filed as: NIIRO MITSUTAKA
8 granted patents·154 citations·filing 1994–2003
87Inventor score
Top patents by PatentIndex Score
8 records- 0187US6411560B1Semiconductor memory device capable of reducing leakage current flowing into substrateMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Jun 25, 2002·48 cites·19 claims
- 0271US5475268ASemiconductor device having an alignment markMITSUBISHI ELECTRIC CORP·Filed 1994·Granted Dec 12, 1995·50 cites·6 claims
- 0366US6785858B2Semiconductor device capable of adjusting timing of input waveform by tester with high accuracyRENESAS TECH CORP·Filed 2001·Granted Aug 31, 2004·13 cites·10 claims
- 0463US6178125B1Semiconductor memory device preventing repeated use of spare memory cell and repairable by cell substitution up to two timesMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Jan 23, 2001·15 cites·12 claims
- 0561US6466509B1Semiconductor memory device having a column select line transmitting a column select signalMITSUBISHI ELECTRIC CORP·Filed 2002·Granted Oct 15, 2002·12 cites·10 claims
- 0660US6885235B2Semiconductor integrated circuit device with internal power supply potential generation circuitMITSUBISHI ELECTRIC ENG·Filed 2002·Granted Apr 26, 2005·11 cites·18 claims
- 0745US6744683B2Semiconductor device removing disconnection defect in fuse element of its program circuit to stably perform coincidence comparison operationRENESAS TECH CORP·Filed 2002·Granted Jun 1, 2004·5 cites·11 claims
- 0836US6794679B2Semiconductor device that can measure timing difference between input and output signalsRENESAS TECH CORP·Filed 2003·Granted Sep 21, 2004·0 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →