Inventor · disambiguated record
Kun-Yuan Chang
Also filed as: CHANG KUN · CHANG KUN-YUAN
4 granted patents·1 pending application·18 citations·filing 2000–2020
71Inventor score
Files withUNITED MICROELECTRONICS CORP2CHANG KUN-YUAN1UNITED MICROELECTRONICS1UNIV CHENGDU TECHNOLOGY1
Top patents by PatentIndex Score
5 records- 0180US10989639B1Experimental test method for subcritical propagation rate of rock fractures based on triaxial stress—strain curveUNIV CHENGDU TECHNOLOGY·Filed 2020·Granted Apr 27, 2021·1 cites·4 claims
- 0259US6586146B2Method of figuring exposure energyUNITED MICROELECTRONICS·Filed 2001·Granted Jul 1, 2003·8 cites·10 claims
- 0359US6350994B1Structure of critical dimension barUNITED MICROELECTRONICS CORP·Filed 2000·Granted Feb 26, 2002·7 cites·12 claims
- 0447US6410357B1Structure of critical dimension barUNITED MICROELECTRONICS CORP·Filed 2001·Granted Jun 25, 2002·2 cites·12 claims
- 0538US2008231474A1Airport runway warning systemCHANG KUN-YUAN·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →