Inventor · disambiguated record
Takayuki Ootani
Also filed as: OOTANI TAKAYUKI
11 granted patents·2 pending applications·200 citations·filing 1988–2023
90Inventor score
Files withTOSHIBA KK8RENESAS ELECTRONICS CORP2FUJITSU SEMICONDUCTOR LTD1SUMITOMO RIKO CO LTD1TOTO LTD1
Top patents by PatentIndex Score
13 records- 0194US5502845ASiphon-jet flush water supply system for toilet stoolTOTO LTD·Filed 1993·Granted Apr 2, 1996·93 cites·19 claims
- 0292US10018935B2Conductive member for electrophotographic machineSUMITOMO RIKO CO LTD·Filed 2017·Granted Jul 10, 2018·3 cites·20 claims
- 0382US4931994AStatic semiconductor memory with section and block sense amplifiersTOSHIBA KK·Filed 1988·Granted Jun 5, 1990·44 cites·14 claims
- 0461US12237838B2Semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2023·Granted Feb 25, 2025·0 cites·9 claims
- 0556US5276369ASense amplifier circuit having a bias current control meansTOSHIBA KK·Filed 1992·Granted Jan 4, 1994·13 cites·19 claims
- 0655US4931998ASemiconductor memory device which can suppress operation error due to power supply noiseTOSHIBA KK·Filed 1989·Granted Jun 5, 1990·14 cites·19 claims
- 0749US2023064905A1Semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2022·Application pending·0 cites
- 0847US4959562AError prevention circuit with capacitive meansTOSHIBA KK·Filed 1989·Granted Sep 25, 1990·8 cites·19 claims
- 0944US2013275646A1Bus circuit and semiconductor deviceFUJITSU SEMICONDUCTOR LTD·Filed 2013·Application pending·0 cites
- 1042US4933905ASemiconductor memory device for reducing power dissipation during a write operationTOSHIBA KK·Filed 1988·Granted Jun 12, 1990·8 cites·4 claims
- 1141US4879686ASemiconductor memory device with a data clear circuitTOSHIBA KK·Filed 1988·Granted Nov 7, 1989·7 cites·12 claims
- 1236US5479371ASemiconductor memory deviceTOSHIBA KK·Filed 1993·Granted Dec 26, 1995·6 cites·8 claims
- 1336US4959560AError preventing circuitTOSHIBA KK·Filed 1989·Granted Sep 25, 1990·4 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →