Inventor · disambiguated record
Janghyuk An
Also filed as: AN JANGHYUK
4 granted patents·8 citations·filing 2015–2023
63Inventor score
Files withSAMSUNG ELECTRONICS CO LTD4
Top patents by PatentIndex Score
4 records- 0180US9658949B2Test system of system on chip and test method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted May 23, 2017·7 cites·20 claims
- 0267US11946967B2Electronic device for managing degree of degradationSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Apr 2, 2024·0 cites·18 claims
- 0361US11181571B2Electronic device for managing degree of degradationSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Nov 23, 2021·1 cites·9 claims
- 0460US12411760B2Memory device and method with compute express link for degradationSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Sep 9, 2025·0 cites·29 claims
Join the waitlist — get patent alerts
Get an alert when Janghyuk An files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →