Inventor · disambiguated record
Roger Proksch
Also filed as: PROKSCH ROGER · PROKSCH ROGER B
50 granted patents·9 pending applications·301 citations·filing 2001–2024
98Inventor score
Files withASYLUM RESEARCH CORP18OXFORD INSTRUMENTS ASYLUM RES INC8PROKSCH ROGER8OXFORD INSTR ASYLUM RES INC6PROKSCH ROGER B4
Top patents by PatentIndex Score
59 records- 0196US7038443B2Linear variable differential transformers for high precision position measurementsASYLUM RESEARCH CORP·Filed 2003·Granted May 2, 2006·54 cites·5 claims
- 0293US9841436B2AM/FM measurements using multiple frequency of atomic force microscopyOXFORD INSTRUMENTS ASYLUM RES INC·Filed 2016·Granted Dec 12, 2017·5 cites·7 claims
- 0393US9453857B2AM/FM measurements using multiple frequency of atomic force microscopyOXFORD INSTR ASYLUM RES INC·Filed 2015·Granted Sep 27, 2016·6 cites·1 claims
- 0493US8302456B2Active damping of high speed scanning probe microscope componentsPROKSCH ROGER·Filed 2007·Granted Nov 6, 2012·15 cites·27 claims
- 0592US8024963B2Material property measurements using multiple frequency atomic force microscopyASYLUM RESEARCH CORP·Filed 2008·Granted Sep 27, 2011·11 cites·3 claims
- 0692US7937991B2Fully digitally controller for cantilever-based instrumentsASYLUM RESEARCH CORP·Filed 2007·Granted May 10, 2011·11 cites·17 claims
- 0791US10444258B2AM/FM measurements using multiple frequency atomic force microscopyOXFORD INSTRUMENTS ASYLUM RES INC·Filed 2017·Granted Oct 15, 2019·3 cites·3 claims
- 0891US10338096B2Metrological scanning probe microscopeOXFORD INSTRUMENTS ASYLUM RES INC·Filed 2017·Granted Jul 2, 2019·3 cites·7 claims
- 0989US8205488B2Fully digitally controller for cantilever-based instrumentsPROKSCH ROGER·Filed 2010·Granted Jun 26, 2012·7 cites·9 claims
- 1089US7603891B2Multiple frequency atomic force microscopyASYLUM RESEARCH CORP·Filed 2006·Granted Oct 20, 2009·10 cites·27 claims
- 1187US9383386B2Optical beam positioning unit for atomic force microscopeOXFORD INSTR ASYLUM RES INC·Filed 2014·Granted Jul 5, 2016·7 cites·18 claims
- 1287US7262592B2Linear variable differential transformers for high precision position measurementsASYLUM RESEARCH CORP·Filed 2006·Granted Aug 28, 2007·6 cites·5 claims
- 1387US6612160B2Apparatus and method for isolating and measuring movement in metrology apparatusVEECO INSTR INC·Filed 2001·Granted Sep 2, 2003·29 cites·63 claims
- 1486US10557865B2Quantitative measurements using multiple frequency atomic force microscopyOXFORD INSTR AFM INC·Filed 2017·Granted Feb 11, 2020·2 cites·11 claims
- 1586US9366693B2Variable density scanningOXFORD INSTR ASYLUM RES CORP·Filed 2015·Granted Jun 14, 2016·4 cites·22 claims
- 1685US8370960B2Modular atomic force microscopeASYLUM RESEARCH CORP·Filed 2009·Granted Feb 5, 2013·14 cites·3 claims
- 1785US7685869B2NanoindenterASYLUM RESEARCH CORP·Filed 2007·Granted Mar 30, 2010·10 cites·1 claims
- 1884US10705114B2Metrological scanning probe microscopeOXFORD INSTRUMENTS ASYLUM RES INC·Filed 2019·Granted Jul 7, 2020·2 cites·14 claims
- 1984US9297827B2Quantitative measurements using multiple frequency atomic force microscopyPROKSCH ROGER B·Filed 2012·Granted Mar 29, 2016·5 cites·14 claims
- 2084US8677809B2Thermal measurements using multiple frequency atomic force microscopyPROKSCH ROGER·Filed 2010·Granted Mar 25, 2014·6 cites·2 claims
- 2184US8196458B2NanoindenterBONILLA FLAVIO ALEJANDRO·Filed 2010·Granted Jun 12, 2012·6 cites·22 claims
- 2284US7941286B2Variable density scanningASYLUM RESEARCH CORP·Filed 2006·Granted May 10, 2011·9 cites·16 claims
- 2383US9581616B2Modular atomic force microscope with environmental controlsOXFORD INSTR ASYLUM RES INC·Filed 2015·Granted Feb 28, 2017·2 cites·22 claims
- 2483US8489356B2Variable density scanningPROKSCH ROGER B·Filed 2011·Granted Jul 16, 2013·5 cites·33 claims
- 2583US7271582B2Linear variable differential transformers for high precision position measurementsASYLUM RESEARCH CORP·Filed 2006·Granted Sep 18, 2007·5 cites·10 claims
- 2682US7434445B2Apparatus for determining cantilever parametersASYLUM RESEARCH CORP·Filed 2006·Granted Oct 14, 2008·7 cites·8 claims
- 2780US9069007B2Multiple frequency atomic force microscopyOXFORD INSTR AFM INC·Filed 2013·Granted Jun 30, 2015·3 cites·17 claims
- 2880US7372254B2Linear force detecting element formed without ferromagnetic materials which produces a resolution in a range of microns or lessASYLUM RESEARCH CORP·Filed 2006·Granted May 13, 2008·4 cites·13 claims
- 2979US10215773B2Material property measurements using multiple frequency atomic force microscopyOXFORD INSTR PLC·Filed 2016·Granted Feb 26, 2019·1 cites·6 claims
- 3079US8448501B2Multiple frequency atomic force microscopyPROKSCH ROGER B·Filed 2009·Granted May 28, 2013·5 cites·19 claims
- 3179US7233140B2Position sensing assembly with sychronizing capabilityASYLUM RESEARCH CORP·Filed 2006·Granted Jun 19, 2007·5 cites·5 claims
- 3279US7084384B2Diffractive optical position detector in an atomic force microscope having a moveable cantileverASYLUM RESEARCH CORP·Filed 2005·Granted Aug 1, 2006·6 cites·11 claims
- 3377US9097737B2Modular atomic force microscope with environmental controlsOXFORD INSTR ASYLUM RES INC·Filed 2013·Granted Aug 4, 2015·3 cites·16 claims
- 3476US10054612B2Optical beam positioning unit for atomic force microscopeOXFORD INSTRUMENTS ASYLUM RES INC·Filed 2016·Granted Aug 21, 2018·1 cites·6 claims
- 3571US9696342B2Quantitative measurements using multiple frequency atomic force microscopyOXFORD INSTR AFM INC·Filed 2016·Granted Jul 4, 2017·1 cites·14 claims
- 3670US9921242B2Automated atomic force microscope and the operation thereofOXFORD INSTRUMENTS ASYLUM RES INC·Filed 2016·Granted Mar 20, 2018·1 cites·19 claims
- 3770US2019195910A1Material Property Measurements Using Multiple Frequency Atomic Force MicroscopyOXFORD INSTR PLC·Filed 2019·Application pending·0 cites
- 3869USRE49997EMetrological scanning probe microscopeOXFORD INSTRUMENTS ASYLUM RES INC·Filed 2021·Granted Jun 4, 2024·0 cites·31 claims
- 3969US8269485B2Linear variable differential transformer with digital electronicsBOCEK DAN·Filed 2003·Granted Sep 18, 2012·10 cites·20 claims
- 4068US8555711B2Material property measurements using multiple frequency atomic fore microscopyPROKSCH ROGER·Filed 2011·Granted Oct 15, 2013·1 cites·26 claims
- 4167US9383388B2Automated atomic force microscope and the operation thereofOXFORD INSTR ASYLUM RES INC·Filed 2015·Granted Jul 5, 2016·1 cites·18 claims
- 4265US9604846B2Thermal measurements using multiple frequency atomic force microscopyASYLUM RESEARCH CORP·Filed 2014·Granted Mar 28, 2017·1 cites·26 claims
- 4364US7234342B2Fully digital controller for cantilever-based instrumentsASYLUM RESEARCH CORP·Filed 2003·Granted Jun 26, 2007·8 cites·8 claims
- 4461US10416190B2Modular atomic force microscope with environmental controlsOXFORD INSTRUMENTS ASYLUM RES INC·Filed 2017·Granted Sep 17, 2019·0 cites·15 claims
- 4559US7066005B2Noncontact sensitivity and compliance calibration method for cantilever-based insturmentsASYLUM RESEARCH CORP·Filed 2002·Granted Jun 27, 2006·2 cites·8 claims
- 4658US9804193B2Metrological scanning probe microscopeOXFORD INSTR ASYLUM RES INC·Filed 2015·Granted Oct 31, 2017·0 cites·3 claims
- 4757US2025164523A1Methods for positioning a measurement spot using a scanning probe microscropeOXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LTD·Filed 2024·Application pending·0 cites
- 4855US10556793B2Thermal measurements using multiple frequency atomic force microscopyASYLUM RES CORPORATION·Filed 2017·Granted Feb 11, 2020·0 cites·35 claims
- 4955US2014041084A1Material Property Measurements Using Multiple Frequency Atomic Fore MicroscopyPROKSCH ROGER·Filed 2013·Application pending·0 cites
- 5055US2017254834A1Modular Atomic Force MicroscopeOXFORD INSTR PLC·Filed 2017·Application pending·0 cites
Showing the top 50 of 59 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →